Results 271 to 280 of about 18,085,785 (304)

Single-event effects rate prediction

IEEE Transactions on Nuclear Science, 1996
Common practices for predicting rates of single-event effects (SEE) in microelectronics in space environments are reviewed. Established rate-prediction models are discussed, and comparison is drawn between alternative approaches with discussion of dominant modeling parameters, assumptions, and limitations and the impact on prediction results.
openaire   +1 more source

BRAM implementation of a single-event upset sensor for adaptive single-event effect mitigation in reconfigurable FPGAs

2017 NASA/ESA Conference on Adaptive Hardware and Systems (AHS), 2017
In this paper, we study the performance of a Block RAM (BRAM)-based embedded radiation sensor for adaptive single-event effect mitigation in FPGAs. To achieve this, we designed custom BRAM wrappers to extend the Xilinx BRAM macros with scrubbing and error correction, for both free and used BRAMs (utilized by the user). A case study demonstrates that in
Robért Glein, Philipp Mengs, Florian Rittner, Rainer Wansch, Albert Heuberger   +4 more
openaire   +2 more sources

Single-Event Effects Test Methods

2019
This chapter presents an overview of main types of single-event effects (SEE), basic characteristics of sensitivity of devices and integrated circuits to SEE and existing standards and guidelines for testing with the use of heavy ion and proton accelerators. Basic requirements for both heavy ion and proton testing will be considered in detail including
openaire   +1 more source

SINGLE EVENT EFFECTS IN AVIONICS AND ON THE GROUND

International Journal of High Speed Electronics and Systems, 2004
Single event effects in electronics caused by the atmospheric neutrons have been an issue for systems using large blocks of random access memory (RAM) in avionics applications as well as those on the ground. At ground level there are two main sources of single event effects, alpha particles from the packaging materials as well as the neutrons, but at ...
openaire   +1 more source

Single Event Effects: Mechanisms and Classification

2010
Single Event Effects (SEEs) induced by heavy ions, protons, and neutrons become an increasing limitation of the reliability of electronic components, circuits, and systems, and have stimulated abundant past and undergoing work for improving our understanding and developing mitigation techniques.
openaire   +1 more source

Lung Cancer Radiation May Increase the Risk of Major Adverse Cardiac Events

Ca-A Cancer Journal for Clinicians, 2019
Mike Fillon
exaly  

Historical Events Leading to the Clinical Application of Radium

Ca-A Cancer Journal for Clinicians, 1966
Edith Quimby
exaly  

The Efficacy of a Single Cytology Smear in the Detection of Cancer of the Cervix

Ca-A Cancer Journal for Clinicians, 1963
W A D Anderson
exaly  

Destructive Single-Event Effects in Semiconductor Devices and ICs

IEEE Transactions on Nuclear Science, 2003
F W Sexton
exaly  

Radiation Hardness Assurance Testing of Microelectronic Devices and Integrated Circuits: Test Guideline for Proton and Heavy Ion Single-Event Effects

IEEE Transactions on Nuclear Science, 2013
Paul E Dodd, James R Schwank, Marty R Shaneyfelt   +2 more
exaly