Impact of Process Variability and Single Event Transient on FinFET Technology
2019 IFIP/IEEE 27th International Conference on Very Large Scale Integration (VLSI-SoC), 2019The evolution of integrated circuits has made them more susceptible to the radiation effects, besides increasing the manufacturing process variability. Traditionally, complex gates are adopted to reduce area, delay and power consumption. However, they can introduce challenges related to a robustness that might be avoided with more regular and basic ...
Leonardo Heitich Brendler +3 more
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An Efficient Design of Single Event Transients Tolerance for Logic Circuits
4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008), 2008In the presence of radiation, particle strikes can cause temporary signal errors in integrated circuits (ICs). Particle strikes that directly affect memory are known as single event upsets (SEUs), while strikes that affect combinational logic are called single event transients (SETs).
Yantu Mo, Suge Yue
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Design sensitivity of single event transients in scaled logic circuits
Proceedings of the 48th Design Automation Conference, 2011Single Event Transients (SET) in digital logic pose an ever increasing reliability challenge as device dimensions shrink in modern technologies. Projection of SET sensitivity with scaling is essential to assess the logic failure and error probability in modern technology generations.
Jyothi Velamala +3 more
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Single Event Upset and Single Event Transient Detection in FPGA-based Search and Rescue Systems
2022 11th Mediterranean Conference on Embedded Computing (MECO), 2022Gehad I. Alkady +7 more
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Simulation of transients caused by single-event upsets in combinational logic
IEEE International Conference on Test, 2005., 2006A comprehensive technique for simulation of transients caused by single-event upsets (SEUs) in combinational logic circuits is described. Based upon linear RC models of gates, the proposed technique integrates a closed-form model for computation of the SEU-induced transient at the site of a particle strike with propagation models for the transients ...
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Single-Event Transient Case Study for System-Level Radiation Effects Analysis
IEEE Transactions on Nuclear Science, 2021Michael J Campola +2 more
exaly
Analysis of location and LET dependence of single event transient in 14 nm SOI FinFET
Nuclear Instruments & Methods in Physics Research B, 2022Baojun Liu
exaly
Single event transient study on PMOS-NMOS cross-coupled LC-VCO using PLL
International Journal of Electronics, 2021Arumugam Karthigeyan
exaly
A Compact Double-Exponential Circuit for Single Event Transient Emulation
2023 38th Conference on Design of Circuits and Integrated Systems (DCIS), 2023Sebastià A. Bota +6 more
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Layout Technique for Single-Event Transient Mitigation via Pulse Quenching
IEEE Transactions on Nuclear Science, 2011Arthur F Witulski +2 more
exaly