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Single-Event Transient Response of InGaAs MOSFETs

IEEE Transactions on Nuclear Science, 2014
The single-event-transient response of InGaAs MOSFETs exposed to heavy-ion and laser irradiations is investigated. The large barrier between the gate oxide and semiconductor regions effectively suppresses the gate transients compared with other types of III-V FETs.
Kai Ni   +12 more
openaire   +1 more source

Single Event Transients in SiGe HBT

2017
When the high-energy charged particles strike the transistors or circuits, an amount of high-density electron hole pairs are generated, and then single event effects are produced when the electron hole pairs are collected by device terminals.
openaire   +1 more source

Single-event transients in high-speed comparators

IEEE Transactions on Nuclear Science, 2002
Single-event transients are investigated in comparators with switching speed below 80 ns, including one BiCMOS device. Modeling results show that the collapse of internal junctions after an ion strike delays the onset of collector current because of transient currents in the substrate that are not shielded by the buried layer.
A.H. Johnston   +3 more
openaire   +1 more source

Analysis of single-event transients in analog circuits

IEEE Transactions on Nuclear Science, 2000
A new methodology for understanding single-event transient (SET) phenomena in analog circuits is described. Device and circuit simulation techniques are coupled in order to reproduce experimental data obtained from the National Semiconductor LM124 operational amplifier and to determine the most sensitive parts of the integrated circuit.
P. Adell   +7 more
openaire   +1 more source

An analytical approach for estimation of single event transients

2016 International Conference on Emerging Technological Trends (ICETT), 2016
Transient faults are a matter of increasing concern as advanced technologies scales to smaller and smaller feature technologies. Transient errors are random faults of the hardware, which also called as soft errors. Single Event Transients (SETs) are major part of the error events which will continue to grow in the next technology nodes and affect the ...
Surya Suseelan, Pooja S Mohan
openaire   +1 more source

CMOS VLSI single event transient characterization

IEEE Transactions on Nuclear Science, 1989
The MOSIS VLSI IC process has been characterized for picosecond single-event transients for large-area diode test structures. Three test structures were designed for a CMOS, p-well, 3- mu m process, including two MOS diodes for SEU transient measurements. Devices were irradiated with 5-MeV boron ions and 5-MeV alpha -particles.
S.J. Heileman   +5 more
openaire   +1 more source

Probabilistic Evaluation of Analog Single Event Transients

IEEE Transactions on Nuclear Science, 2007
We propose a procedure to estimate the consequences of an analog single event transient (ASET). The method qualifies ASETs based on their frequency domain signatures and determines the probability of a single event transient induced error.
Amy V. Kauppila   +3 more
openaire   +1 more source

Impact of gate shapes on single event transients

2014 IEEE International Conference on Electron Devices and Solid-State Circuits, 2014
3D-TCAD simulations in a 0.18um process are used to show the effect of gate shapes on the single event transients of both PMOS and NMOS. The results turn out that the SET pulse widths of enclosed layout transistors are much smaller than the standard layout transistors.
null Zhao Xinyuan   +2 more
openaire   +1 more source

Single event transients in deep submicron CMOS

42nd Midwest Symposium on Circuits and Systems (Cat. No.99CH36356), 2003
Single event transients (SET) occur when an energetic subatomic particle strikes a combinational logic element. The charge deposited by the particle causes a transient voltage disturbance, which can propagate to a storage element and be latched, resulting in single event upset (SEU).
K.J. Hass, J.W. Ambles
openaire   +1 more source

Single Event Upset and Single Event Transient Detection in FPGA-based Search and Rescue Systems

2022 11th Mediterranean Conference on Embedded Computing (MECO), 2022
Gehad I. Alkady   +7 more
openaire   +1 more source

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