Results 271 to 280 of about 8,243,533 (301)
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Single-Event Transient Response of InGaAs MOSFETs
IEEE Transactions on Nuclear Science, 2014The single-event-transient response of InGaAs MOSFETs exposed to heavy-ion and laser irradiations is investigated. The large barrier between the gate oxide and semiconductor regions effectively suppresses the gate transients compared with other types of III-V FETs.
Kai Ni +12 more
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Single Event Transients in SiGe HBT
2017When the high-energy charged particles strike the transistors or circuits, an amount of high-density electron hole pairs are generated, and then single event effects are produced when the electron hole pairs are collected by device terminals.
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Single-event transients in high-speed comparators
IEEE Transactions on Nuclear Science, 2002Single-event transients are investigated in comparators with switching speed below 80 ns, including one BiCMOS device. Modeling results show that the collapse of internal junctions after an ion strike delays the onset of collector current because of transient currents in the substrate that are not shielded by the buried layer.
A.H. Johnston +3 more
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Analysis of single-event transients in analog circuits
IEEE Transactions on Nuclear Science, 2000A new methodology for understanding single-event transient (SET) phenomena in analog circuits is described. Device and circuit simulation techniques are coupled in order to reproduce experimental data obtained from the National Semiconductor LM124 operational amplifier and to determine the most sensitive parts of the integrated circuit.
P. Adell +7 more
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An analytical approach for estimation of single event transients
2016 International Conference on Emerging Technological Trends (ICETT), 2016Transient faults are a matter of increasing concern as advanced technologies scales to smaller and smaller feature technologies. Transient errors are random faults of the hardware, which also called as soft errors. Single Event Transients (SETs) are major part of the error events which will continue to grow in the next technology nodes and affect the ...
Surya Suseelan, Pooja S Mohan
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CMOS VLSI single event transient characterization
IEEE Transactions on Nuclear Science, 1989The MOSIS VLSI IC process has been characterized for picosecond single-event transients for large-area diode test structures. Three test structures were designed for a CMOS, p-well, 3- mu m process, including two MOS diodes for SEU transient measurements. Devices were irradiated with 5-MeV boron ions and 5-MeV alpha -particles.
S.J. Heileman +5 more
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Probabilistic Evaluation of Analog Single Event Transients
IEEE Transactions on Nuclear Science, 2007We propose a procedure to estimate the consequences of an analog single event transient (ASET). The method qualifies ASETs based on their frequency domain signatures and determines the probability of a single event transient induced error.
Amy V. Kauppila +3 more
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Impact of gate shapes on single event transients
2014 IEEE International Conference on Electron Devices and Solid-State Circuits, 20143D-TCAD simulations in a 0.18um process are used to show the effect of gate shapes on the single event transients of both PMOS and NMOS. The results turn out that the SET pulse widths of enclosed layout transistors are much smaller than the standard layout transistors.
null Zhao Xinyuan +2 more
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Single event transients in deep submicron CMOS
42nd Midwest Symposium on Circuits and Systems (Cat. No.99CH36356), 2003Single event transients (SET) occur when an energetic subatomic particle strikes a combinational logic element. The charge deposited by the particle causes a transient voltage disturbance, which can propagate to a storage element and be latched, resulting in single event upset (SEU).
K.J. Hass, J.W. Ambles
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Single Event Upset and Single Event Transient Detection in FPGA-based Search and Rescue Systems
2022 11th Mediterranean Conference on Embedded Computing (MECO), 2022Gehad I. Alkady +7 more
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