Results 251 to 260 of about 214,395 (302)

Efficient analysis of single event transients

Journal of Systems Architecture, 2004
The effects of charged particles striking VLSI circuits and producing single event transients (SETs) are becoming an issue for designers who exploit deep sub-micron technologies; efficient and accurate techniques for assessing their impact on VLSI designs are thus needed.
SONZA REORDA, Matteo, VIOLANTE, MASSIMO
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Single event transients in dynamic logic

Proceedings of the 19th annual symposium on Integrated circuits and systems design, 2006
Radiation effects, like Single Event Transients (SET), are increasingly affecting integrated circuits as device dimensions are scaling down. With decreasing dimensions and supply voltages, the charge used to store information decreases, turning the circuits more sensitive to the transient currents generated by energetic particle hits.
Gilson I. Wirth, Ivandro Ribeiro, Michele G. Vieira, Fernanda Gusmão de Lima Kastensmidt   +3 more
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Single event transient effects in a voltage reference

Microelectronics Reliability, 2005
Abstract The Single Event Transient response of the LM236 band gap voltage reference from Texas Instruments is analyzed through heavy ion experiments and simulation. The LM236 circuit calibration was performed using generic transistor parameters that were subsequently optimized using device and circuit simulations.
P. C. Adell, Ronald D. Schrimpf, C. R. Cirba, W. T. Holman, X. Zhu, Hugh J. Barnaby, O. Mion   +6 more
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Current Transients in Single Nanoparticle Collision Events

Journal of the American Chemical Society, 2008
Electrochemical hydrazine oxidation and proton reduction occur at a significantly higher rate at Pt than at Au or C electrodes. Thus, the collision and adhesion of a Pt particle on a less active Au or C electrode leads to a large current amplification by electrocatalysis at single nanoparticles (NPs). At low particle concentrations, the collision of Pt
Xiaoyin, Xiao, Fu-Ren F, Fan, Jiping, Zhou, Allen J, Bard   +3 more
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A model for single-event transients in comparators

IEEE Transactions on Nuclear Science, 2000
A two-step modeling approach is developed for single-event transients in linear circuits that uses the PISCES device simulation program to calculate transient currents in key internal transistor structures. Those currents are then applied at the circuit level using the SPICE circuit analysis program.
A.H. Johnston, G.M. Swift, T.F. Miyahira, L.D. Edmonds   +3 more
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A compendium of single event transient data

2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588), 2002
We present a compendium on observed Single Event Transients on analog and digital circuits. Both the data and the test methods used are presented.
M.W. Savage, T. Turflinger, J.W. Howard, S. Buchner   +3 more
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Single event transients in operational amplifiers

IEEE Radiation Effects Data Workshop, 2005., 2005
A number of bipolar operational amplifiers have been evaluated for single event effects for possible use in a space application. Various trigger thresholds were used to estimate the distribution of transient amplitudes.
J. George, R. Koga, S. Crain, P. Yu, S. Nguyen, E. Normandy, D. Kachuche, B.K. Steffan   +7 more
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Single-Event Transients in Voltage Regulators

IEEE Transactions on Nuclear Science, 2006
Single-event transients are investigated for two voltage regulator circuits that are widely used in space. A circuit-level model is developed that can be used to determine how transients are affected by different circuit application conditions. Internal protection circuits-which are affected by load as well as internal thermal effects-can also be ...
Johnston, A. H., Miyahira, T. F., Irom, F., Laird, J. S.   +3 more
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Single Event Transient Tolerant Bloom Filter Implementations

IEEE Transactions on Computers, 2017
Bloom filters have been used to reduce the delay in networking and computing applications when a set membership check is to be applied. Error sources can affect the behavior of Bloom filters resulting in a wrong outcome of this membership test and a possible effect in the system's output.
Alfonso Sánchez-Macián, Pedro Reviriego, Juan Antonio Maestro, Shanshan Liu 0001   +3 more
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Systematic analyses for latching probability of single-event transients

Fifteenth International Symposium on Quality Electronic Design, 2014
Soft errors caused by particle strikes are expected to increase as technology scales down. This is partially because more single-event transients (SET) are latched by memory elements at the primary output of combinational circuits. To speed up the assessment of SET-induced soft errors, we propose a systematic analysis method to examine the probability ...
Hoda Pahlevanzadeh, Qiaoyan Yu
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