Results 61 to 70 of about 8,243,533 (301)
FEBS Letters, EarlyView.Mycobacterial 3‐methylcrotonyl‐CoA carboxylase uses a mobile biotin‐carrying domain to shuttle a carboxyl group between two catalytic sites, enabling carboxylation of 3‐methylcrotonyl‐CoA during leucine breakdown. Cryo‐electron microscopy captures the carrier at both sites and reveals an inward loop movement that may prevent futile rebinding to the ...
Ajit Yadav +2 more
wiley +1 more source
An Evolutionary Approach to the Soft Error Mitigation Technique for Cell-Based Design
Advances in Electrical and Computer Engineering, 2015 In this paper, we present a soft error mitigation algorithm that searches for the proper gate sizes within constrained gate-level designs. The individual gate sizing has an impact on the former optimization results and degrades the quality of the ...
PARK, J. K., KIM, J. T.
doaj +1 more source
Characterization and modelling of single event transients in LDMOS-SOI FETs
Microelectronics Reliability, 2011 In this paper, we develop a model to simulate the single event transient (SET) phenomena in LDMOS-SOI devices. 3D simulations and compact model are coupled in order to reproduce the current pulse in LDMOS-SOI device generated by an ion strike through the different device locations, at various biases and temperatures.
Joaquín Alvarado +3 more
openaire +2 more sources
The Shewanella oneidensis Fic enzyme SoFic targets the switch‐I region of EF‐Tu for AMPylation
FEBS Letters, EarlyView.Fic enzymes mediate diverse post‐translational modifications across all domains of life, including AMPylation. Prokaryotic EF‐Tu can be AMPylated and deAMPylated by the conserved Fic enzyme SoFic. Structural and biochemical approaches were used to characterize the effect of AMPylation on EF‐Tu, SoFic's enzymatic activities, and the enzyme‐target ...
Svenja Runge +6 more
wiley +1 more source
The Journal of Engineering, 2017 Owing to aggressive shrinking in nanometre scale as well as faster devices, particle strike manifesting itself into transient fault spanning multiple cycle and multiple units will be the centre-focus of application specific datapath generated through ...
Anirban Sengupta, Deepak Kachave
doaj +1 more source
Prospecting the protein design landscape
FEBS Letters, EarlyView.This review outlines the current state of various protein design approaches. We discuss the current possibilities enabled by recently released tools, highlight future avenues to pursue in protein design, and underscore the crucial role of key databases and resources for successful protein design workflows.
Jakob R. Riccabona +4 more
wiley +1 more source
Xilinx Kintex-UltraScale Field Programmable Gate Array Single Event Effects (SEE) Heavy-Ion Test Report [PDF]
, 2018 This is an independent investigation that evaluates the single event destructive and transient susceptibility of the Xilinx Kintex-UltraScale device. Design/Device susceptibility is determined by monitoring the device under test (DUT) for Single Event ...
Seidleck, Christina +5 more
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Artificial molecular machines and motors—Design and control of nanoscale motion
FEBS Letters, EarlyView.Molecules are constantly moving because of thermal fluctuations, but random motion alone cannot be exploited to perform directional tasks. Artificial molecular machines use chemical, electrical, or light energy to bias this motion. Molecular shuttles, rotary motors, and supramolecular pumps illustrate how nanoscale movement can be controlled and ...
Leonardo Andreoni, Alberto Credi
wiley +1 more source
A Cell Sizing Technique for Mitigating Logic Soft Errors in Gate-level Designs
Advances in Electrical and Computer Engineering, 2013 The effect of logic soft errors on the degradation of the reliability becomes more crucial in the case of nano-meter semiconductor designs. Several hardening techniques have been reported from the transistor- to system-level.
KIM, J. T., PARK, J. K.
doaj +1 more source
Single Event Transient Sensitivity Measurement and Worst-Case Test Vector Exploration for ASIC Devices Exposed to Space Single Event Environment [PDF]
, 2022 Space radiation and nuclear reactors produce single event effects (SEE) in electronic circuits and impact their performance. The SEE phenomena cause circuits and electronic devices to fail by producing faulty results.
Wael, Mohamed
core