Results 41 to 50 of about 214,395 (302)

Update of Single Event Effects Radiation Hardness Assurance of Readout Integrated Circuit of Infrared Image Sensors at Cryogenic Temperature

Sensors, 2018
This paper review presents Single Event Effects (SEE) irradiation tests under heavy ions of the test-chip of D-Flip-Flop (DFF) cells and complete readout integrated circuits (ROIC) as a function of temperature, down to 50 K.
Laurent Artola, Ahmad Al Youssef, Samuel Ducret, Franck Perrier, Raphael Buiron, Olivier Gilard, Julien Mekki, Mathieu Boutillier, Guillaume Hubert, Christian Poivrey   +9 more
doaj   +1 more source

Simulation of heavy ion irradiation effect on 3D MOSFET

AIP Advances, 2023
Single event upset effect is an important factor that causes performance degradation and functional failure of aerospace equipment components in space radiation environment.
Ke Li, Jianhong Hao, Qiang Zhao, Fang Zhang, Zhiwei Dong   +4 more
doaj   +1 more source

Single Event Transients in CMOS Ring Oscillators [PDF]

Electronics, 2019
In this paper, a time-variant analysis is made on Single-Event Transients (SETs) in integrated CMOS ring oscillators. The Impulse Sensitive Function (ISF) of the oscillator is used to analyze the impact of the relative moment when a particle hits the circuit. The analysis is based on simulations and verified experimentally with a Two-Photon Absorption (
Prinzie, Jeffrey, De Smedt, Valentijn
openaire   +1 more source

Single Event Transient Tolerance Analysis in 8051 Microprocessor Using Scan Chain

, 2016
As semi-conductor manufacturing technology evolves; the single event transient problem becomes more significant issue. Single event transient has a critical impact on both combinational and sequential logic circuits, so it is important to evaluate the ...
Jong Kang Park, Jun Sung Go, Jong Tae Kim   +2 more
core   +1 more source

Prediction of Single-Event Effects in FDSOI Devices Based on Deep Learning

Micromachines, 2023
Single-event effects (SEE) are an important index of radiation resistance for fully depleted silicon on insulator (FDSOI) devices. The research into traditional FDSOI devices is based on simulation software, which is time consuming, requires a large ...
Rong Zhao, Shulong Wang, Shougang Du, Jinbin Pan, Lan Ma, Shupeng Chen, Hongxia Liu, Yilei Chen   +7 more
doaj   +1 more source

Comparative Evaluation of Hemodiafiltration, Hemoperfusion, and Standard Hemodialysis on Efficacy, Inflammatory Control, Dialysis Adequacy, and Safety in End‐Stage Renal Disease: A Prospective Observational Study

Therapeutic Apheresis and Dialysis, EarlyView.
ABSTRACT Background Chronic micro‐inflammation in patients with end‐stage renal disease (ESRD) is a significant driver of cardiovascular complications and diminished quality of life. While standard hemodialysis (SHD) effectively manages small‐molecule clearance, its ability to remove medium‐to‐large uremic toxins—the primary catalysts of systemic ...
Hongwei Zuo, Weisi Dai, Jie Mao, Mei Ye, Xingshan Lu, Xiaocui Zhang   +5 more
wiley   +1 more source

Simulation of Single-event Irradiation Damage Effects on GaN-based LEDs

Yuanzineng kexue jishu
Light-emitting diodes (LEDs) as keydevices in the fields of space exploration and nuclear technology hold broad application prospects. However, in space applications, LEDs face challenges from the radiation environment, which poses a serious threat to ...
JIANG Rongyu1, WANG Zujun2, YANG Xin1, CHEN Minglei3, WANG Pensheng2
doaj   +1 more source

Safety of Daprodustat for the Treatment of Chronic Kidney Disease Anemia: Final Analysis of a Multicenter Postmarketing Surveillance Study in Japan

Therapeutic Apheresis and Dialysis, EarlyView.
ABSTRACT Introduction This final analysis of a multicenter, prospective postmarketing surveillance study evaluated the safety of daprodustat in patients with chronic kidney disease anemia in routine clinical practice in Japan. Methods Patients who initiated daprodustat between September 2020 and July 2022 were registered.
Tadao Akizawa, Kyomi Kanaya, Kiyomi Aizawa, Masanori Onoki, Hirofumi Ozeki, Kazuko Suzuki, Ai Hayashi, Tomohiko Asamura   +7 more
wiley   +1 more source

Optimized Simulation Analysis for Single Event Transient in Nanoscale Logical Cells

Yuanzineng kexue jishu
Single event transient (SET) induced by high energy single particle radiation is the main threat to space application electronic system reliability.
WANG Tan,  DING Lili,  LUO Yinhong,  ZHAO Wen,  ZHANG Fengqi,  XU Jingyan
doaj   +1 more source

Forecasting the Dialysis Burden in Japan: Validation‐Based Projections of Prevalence and Incidence Through 2050

Therapeutic Apheresis and Dialysis, EarlyView.
ABSTRACT Background Japan has one of the highest dialysis prevalence rates worldwide and a shrinking, aging population. Whether dialysis burden has entered a sustained post‐peak phase or whether recent declines partly reflect pandemic‐related disruptions remains uncertain.
Hatice Şahin, Berrak Itır Aylı, Nüket Paksoy   +2 more
wiley   +1 more source