Results 21 to 30 of about 8,243,533 (301)
Design and Analysis of SEU Hardened Latch for Low Power and High Speed Applications
Journal of Low Power Electronics and Applications, 2019 Due to the reduction in technology scaling, gate capacitance and charge storage in sensitive nodes are rapidly decreasing, making Complementary Metal Oxide Semiconductor (CMOS) circuits more sensitive to soft errors caused by radiation.
Satheesh Kumar S, Kumaravel S
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Single event transient tolerant frequency divider
IET Computers & Digital Techniques, 2014 This study presents a single event upset (SEU) tolerant frequency divider that compares the counted number of rising clock edges with the expected value. The number of counted rising edges being less than expected generally implies that the state is corrupted resulting in faulty output, so the faulty frequency divider is reset to a proper state to ...
Xiaoxuan She, Ningxi Li
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On the mitigation of single event transients on flash-based FPGAs
2018 IEEE 23rd European Test Symposium (ETS), 2018 Thanks to the immunity against Single Event Upsets in configuration memory, Flash-based FPGA is becoming widely adopted in mission- and safety-critical applications, such as in aerospace field. However, the decreasing of device feature size leads to an increasing of the device sensitivity regarding Single Event Transients (SETs).
Sarah Azimi, Boyang Du, Luca Sterpone
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Investigation of Radiation Effects on FD-SOI Hall Sensors by TCAD Simulations
Sensors, 2020 This work investigates the responses of the fully-depleted silicon-on-insulator (FD-SOI) Hall sensors to the three main types of irradiation ionization effects, including the total ionizing dose (TID), transient dose rate (TDR), and single event ...
Linjie Fan +3 more
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A Single-Event-Hardened Scheme of Phase-Locked Loop Microsystems for Aerospace Applications
Micromachines, 2022 In order to improve the ability of the phase-locked loop (PLL) microsystem applied in the aerospace environment to suppress the irradiation effect, this study presents an efficient charge pump hardened scheme by using the radiation-hardened-by-design ...
Qi Xiang, Hongxia Liu, Yulun Zhou
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Single event sensitivity analysis of bandgap reference
Dianzi Jishu Yingyong, 2018 Based on the conventional design of bandgap reference using 0.18 μm process, the single event transient pulse current model was used to analyze the single event sensitivity of common CMOS two-stage amplifiers. The vertical type PNP transistor used in the
Sui Chenglong +6 more
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Characterization of Heavy Ion Induced SET Features in 22-nm FD-SOI Testing Circuits
IEEE Access, 2020 With device scaling-down, circuits appear more susceptible to transient faults especially for the bulk silicon process. Thus, FD-SOI technology has been widely popular in serious radiation environment due to its high radiation-tolerance inherence created
Chang Cai +6 more
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Single-Event-Transient Resilient Memory for DSP in Space Applications [PDF]
2018 IEEE 23rd International Conference on Digital Signal Processing (DSP), 2018 We present a radiation-hardened-by-design (RHBD) memory design that mitigates Single-Event-Transients (SETs), Single-Event-Upsets (SEUs) and Dual-Event-Upsets (DEUs), hence significantly enhancing the reliability of digital signal processors (DSPs) for space applications.
Lwin, Ne Kyaw Zwa +5 more
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Mitigation of Single-Event Effects in SiGe-HBT Current-Mode Logic Circuits
Sensors, 2020 It has been known that negative feedback loops (internal and external) in a SiGe heterojunction bipolar transistors (HBT) DC current mirrors improve single-event transient (SET) response; both the peak transient current and the settling time ...
Md Arifur R. Sarker +8 more
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Investigation of Incident Angle Dependence of Single Event Transient Model in MOSFET
, 2023 As the manufacturing process level of semiconductor devices continues to improve, the device size gradually decreases, and the devices are affected by the single event effect more and more severely.
Yibo Wang +4 more
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