Efficient Modeling of Single Event Transient Effect with Limited Peak Current: Implications for Logic Circuits [PDF]
The problem that the conventional double-exponential transient current model (DE model) can overdrive the circuit, which leads to the overestimation of the soft error rate of the logic cell, is solved.
Yujian Wang +6 more
doaj +3 more sources
Study on Single-Event Transient Hardness of Semi-Enclosed Gate NMOS
Based on the simulation software, single-event transient (SET) simulations were conducted on semi-enclosed gate NMOS devices. The simulation involved bombarding the semi-enclosed gate NMOS devices with heavy ions under specific conditions.
Zhuoxiang Wang, Gang Li, Minghua Tang
doaj +2 more sources
Heavy Ions Induced Single-Event Transient in SiGe-on-SOI HBT by TCAD Simulation [PDF]
In this work, the effects of heavy ion strike position, incident angle, linear energy transfer (LET) value, ambient temperature, bias conditions, and the synergistic effects of total dose irradiation on the single-event transient (SET) in silicon ...
Yuedecai Long +10 more
doaj +2 more sources
On the Mitigation of Single Event Transient in 3D LUT by In-Cell Layout Resizing [PDF]
We propose a workflow for the analysis and mitigation of 3D ICs to Single Event Transient by upsizing the sensitive transistors.
Sarah Azimi +3 more
core +1 more source
Prediction of Single Event Effects in FinFET Devices Based on Deep Learning
The Single Event Effect (SEE) of FinFET devices has become one of the challenging issues affecting the reliability of modern electronic systems in space and terrestrial applications.
Haiyu Liu +7 more
doaj +1 more source
Single-Event Upset Analysis and Protection in High Speed Circuits [PDF]
The effect of single-event transients (SETs) (at a combinational node of a design) on the system reliability is becoming a big concern for ICs manufactured using advanced technologies. An SET at a node of combinational part may cause a transient pulse at
Lofti-Kamran, P. +13 more
core +1 more source
BackgroundBipolar devices used in space radiation environment for a long time are simultaneously threatened by the total ionization dose (TID) effect and single event transient (SET), and there is a synergistic effect between TID and SET.
CAI Jiao +8 more
doaj +1 more source
Single Event Effects in CMOS Image Sensors [PDF]
In this work, 3T Active Pixel Sensors (APS) are exposed to heavy ions (N, Ar, Kr, Xe), and Single Event Effects (SEE) are studied. Devices were fully functional during exposure, no Single Event Latch-up (SEL) or Single Event Functional Interrupt (SEFI ...
Goiffon, Vincent +4 more
core +1 more source
Modification of the LM124 Single Event Transients by Load Resistors [PDF]
The influence of a load resistor on the shape of the single event transients was investigated in the LM124 operational amplifier by means of laser tests. These experiments indicated that, as a general rule, load resistors modify the size of the transients.
Franco Peláez, Francisco Javier +3 more
openaire +3 more sources
Steady-state visual evoked potentials can be explained by temporal superposition of transient event-related responses [PDF]
<p><b>Background:</b> One common criterion for classifying electrophysiological brain responses is based on the distinction between transient (i.e. event-related potentials, ERPs) and steady-state responses (SSRs).
Paula Pazo-Alvarez +24 more
core +2 more sources

