Results 11 to 20 of about 213,131 (262)

Single Event Transient tolerant Count Min Sketches

open access: yesMicroelectronics Reliability, 2022
Frequency estimation is a common operation in big data processing. In many big data applications, computing the exact data frequency is not practical as it requires a large computational effort. Instead, a reasonably accurate estimate is commonly used.
Zhu, Jinhua   +3 more
openaire   +2 more sources

Current mirror with charge dissipation transistor for analogue single‐event transient mitigation in space application

open access: yesIET Circuits, Devices and Systems, 2021
Current mirror utilizing an extra transistor for single‐event‐induced charge dissipation is proposed. This technique involves two inverters and a dissipation transistor. The inverters are employed as a sensor that turns on the dissipation transistor when
Jingtian Liu   +5 more
doaj   +1 more source

Modification of the LM124 Single Event Transients by Load Resistors [PDF]

open access: yesIEEE Transactions on Nuclear Science, 2010
The influence of a load resistor on the shape of the single event transients was investigated in the LM124 operational amplifier by means of laser tests. These experiments indicated that, as a general rule, load resistors modify the size of the transients.
Franco Peláez, Francisco Javier   +3 more
openaire   +3 more sources

Synergistic effect of total ionization dose and single event transient in bipolar operational amplifier LM158

open access: yesHe jishu, 2021
BackgroundBipolar devices used in space radiation environment for a long time are simultaneously threatened by the total ionization dose (TID) effect and single event transient (SET), and there is a synergistic effect between TID and SET.
CAI Jiao   +8 more
doaj   +1 more source

Design and Analysis of SEU Hardened Latch for Low Power and High Speed Applications

open access: yesJournal of Low Power Electronics and Applications, 2019
Due to the reduction in technology scaling, gate capacitance and charge storage in sensitive nodes are rapidly decreasing, making Complementary Metal Oxide Semiconductor (CMOS) circuits more sensitive to soft errors caused by radiation.
Satheesh Kumar S, Kumaravel S
doaj   +1 more source

Single event transient tolerant frequency divider

open access: yesIET Computers & Digital Techniques, 2014
This study presents a single event upset (SEU) tolerant frequency divider that compares the counted number of rising clock edges with the expected value. The number of counted rising edges being less than expected generally implies that the state is corrupted resulting in faulty output, so the faulty frequency divider is reset to a proper state to ...
Xiaoxuan She, Ningxi Li
openaire   +1 more source

On the mitigation of single event transients on flash-based FPGAs

open access: yes2018 IEEE 23rd European Test Symposium (ETS), 2018
Thanks to the immunity against Single Event Upsets in configuration memory, Flash-based FPGA is becoming widely adopted in mission- and safety-critical applications, such as in aerospace field. However, the decreasing of device feature size leads to an increasing of the device sensitivity regarding Single Event Transients (SETs).
Sarah Azimi, Boyang Du, Luca Sterpone
openaire   +2 more sources

Investigation of Radiation Effects on FD-SOI Hall Sensors by TCAD Simulations

open access: yesSensors, 2020
This work investigates the responses of the fully-depleted silicon-on-insulator (FD-SOI) Hall sensors to the three main types of irradiation ionization effects, including the total ionizing dose (TID), transient dose rate (TDR), and single event ...
Linjie Fan   +3 more
doaj   +1 more source

A Single-Event-Hardened Scheme of Phase-Locked Loop Microsystems for Aerospace Applications

open access: yesMicromachines, 2022
In order to improve the ability of the phase-locked loop (PLL) microsystem applied in the aerospace environment to suppress the irradiation effect, this study presents an efficient charge pump hardened scheme by using the radiation-hardened-by-design ...
Qi Xiang, Hongxia Liu, Yulun Zhou
doaj   +1 more source

Mitigation of Single-Event Effects in SiGe-HBT Current-Mode Logic Circuits

open access: yesSensors, 2020
It has been known that negative feedback loops (internal and external) in a SiGe heterojunction bipolar transistors (HBT) DC current mirrors improve single-event transient (SET) response; both the peak transient current and the settling time ...
Md Arifur R. Sarker   +8 more
doaj   +1 more source

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