Results 31 to 40 of about 8,243,533 (301)

Update of Single Event Effects Radiation Hardness Assurance of Readout Integrated Circuit of Infrared Image Sensors at Cryogenic Temperature

open access: yesSensors, 2018
This paper review presents Single Event Effects (SEE) irradiation tests under heavy ions of the test-chip of D-Flip-Flop (DFF) cells and complete readout integrated circuits (ROIC) as a function of temperature, down to 50 K.
Laurent Artola   +9 more
doaj   +1 more source

Ultrafast, Single-Event Ptychographic Imaging of Transient Electron Dynamics

open access: yesUltrafast Science
Dynamic phenomena occurring on the ultrafast time scales are inherently difficult to image. While pump–probe techniques have been used for decades, probing nonrepeatable phenomena precludes this form of imaging.
Jonathan Barolak   +6 more
doaj   +1 more source

Investigation of Single-Event-Transient Effects Induced by Heavy-Ion in All-Silicon DG-TFET

open access: yesIEEE Access, 2022
The heavy-ion analysis is a single-event-effect (SEE) that produces a single-event-transient (SET) pulse of current. In this work, the analysis was done to observe the maximum impact of heavy-ions on a calibrated double-gate tunnel field-effect ...
Ashish Maurya   +3 more
doaj   +1 more source

Single Event Transient Study of pMOS Transistors in 65 nm Technology With and Without a Deep n+ Well Under Particle Striking

open access: yesIEEE Access, 2019
In triple-well PMOSFET transistor, a deep n+ well (DNW) is a process used to isolate the substrate noise, which can lead to changes in effect of single event transient (SET). In outer space, collision of cosmic energetic particles with sensitive nodes of
Jizuo Zhang   +4 more
doaj   +1 more source

Simulation of heavy ion irradiation effect on 3D MOSFET

open access: yesAIP Advances, 2023
Single event upset effect is an important factor that causes performance degradation and functional failure of aerospace equipment components in space radiation environment.
Ke Li   +4 more
doaj   +1 more source

“We Cannot Talk as a Family”: Complexities of Survivorship Communication Among Hispanic/Latino Young Adult Survivors of Childhood Cancer, Parents, and Clinicians

open access: yesPediatric Blood &Cancer, EarlyView.
ABSTRACT Background Young adult childhood cancer survivors (YA‐CCS) have an increased risk of treatment‐related health complications throughout their lives. Lifelong survivorship care is recommended, yet many YA‐CCS experience disruptions in care during pediatric‐to‐adult transitions and do not receive recommended survivorship care.
Kevin Shanchen Pu   +8 more
wiley   +1 more source

Simulation of Single-event Irradiation Damage Effects on GaN-based LEDs

open access: yesYuanzineng kexue jishu
Light-emitting diodes (LEDs) as keydevices in the fields of space exploration and nuclear technology hold broad application prospects. However, in space applications, LEDs face challenges from the radiation environment, which poses a serious threat to ...
JIANG Rongyu1, WANG Zujun2, YANG Xin1, CHEN Minglei3, WANG Pensheng2
doaj   +1 more source

Prediction of Single-Event Effects in FDSOI Devices Based on Deep Learning

open access: yesMicromachines, 2023
Single-event effects (SEE) are an important index of radiation resistance for fully depleted silicon on insulator (FDSOI) devices. The research into traditional FDSOI devices is based on simulation software, which is time consuming, requires a large ...
Rong Zhao   +7 more
doaj   +1 more source

Classical Complement Pathway Inhibition in a Pediatric Patient With Refractory Immune Thrombocytopenia

open access: yesPediatric Blood &Cancer, EarlyView.
ABSTRACT Pediatric refractory immune thrombocytopenia (rITP) is generally characterized by persistent thrombocytopenia and failure to achieve a sustained response to multiple standard therapies. We report a 4‐year‐old female with congenital tufting enteropathy, post‐intestinal transplant patient on immunosuppressants, who developed severe rITP ...
Sarah Hsieh   +4 more
wiley   +1 more source

Optimized Simulation Analysis for Single Event Transient in Nanoscale Logical Cells

open access: yesYuanzineng kexue jishu
Single event transient (SET) induced by high energy single particle radiation is the main threat to space application electronic system reliability.
WANG Tan,  DING Lili,  LUO Yinhong,  ZHAO Wen,  ZHANG Fengqi,  XU Jingyan
doaj   +1 more source

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