Results 91 to 100 of about 312,838 (207)

NASA Electronic Parts and Packaging (NEPP) Field Programmable Gate Array (FPGA) Single Event Effects (SEE) Test Guideline Update [PDF]

The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic versus mission specific device evaluation, single event latch-up (SEL) test and analysis, SEE response visibility enhancement during radiation testing ...
Berg, Melanie D., LaBel, Kenneth A.
core   +1 more source

NEPP Independent Single Event Upset Testing of the Microsemi RTG4: Preliminary Data [PDF]

We present an independent investigation of heavy-ion single event effect data for the Microsemi RTG4 field programmable gate array (FPGA)
Berg, Melanie, LaBel, Kenneth, Pellish, Jonathan   +2 more
core   +1 more source

Spartan Daily, March 26, 2019 [PDF]

, 2019
Volume 152, Issue 26https://scholarworks.sjsu.edu/spartan_daily_2019/1025/thumbnail ...
San Jose State University, School of Journalism and Mass Communications
core   +2 more sources

Single event upset studies on the APV6 front end readout chip [PDF]

, 1999
Bisello, D, French, M, Fulcher, J R, Hall, G, Jones, L, Kaminski, A, Paccagnella, A, Raymond, M, Stavitski, I, Wyss, J   +9 more
core   +1 more source

Single Event Upset tests of commercial FPGA for space applications [PDF]

, 2001
Mattsson, S
core   +1 more source

Incorporating Probability Models of Complex Test Structures to Perform Technology Independent FPGA Single Event Upset Analysis [PDF]

We present SEU test and analysis of the Microsemi ProASIC3 FPGA. SEU Probability models are incorporated for device evaluation.
Berg, M. D., Friendlich, M. A., Kim, H. S., LaBel, K. A., Perez, C. E., Seidlick, C. M.   +5 more
core   +1 more source

NASA Electronic Parts and Packaging Field Programmable Gate Array Single Event Effects Test Guideline Update [PDF]

The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic versus mission specific device evaluation, single event latch-up (SEL) test and analysis, SEE response visibility enhancement during radiation testing ...
Berg, Melanie D., LaBel, Kenneth A.
core   +1 more source

Single event upset tests of an 80Mbit/s optical receiver [PDF]

, 2000
6th Workshop on Electronics for LHC Experiments, Berger, Guy, Faccio, F., Gill, K., Huhtinen, M., Marchioro, A., Moreira, P., Vasey, F.   +7 more
core   +1 more source

Radiation Mitigation and Power Optimization Design Tools for Reconfigurable Hardware in Orbit [PDF]

The Reconfigurable Hardware in Orbit (RHinO)project is focused on creating a set of design tools that facilitate and automate design techniques for reconfigurable computing in space, using SRAM-based field-programmable-gate-array (FPGA) technology.
French, Matthew, Graham, Paul, Larchev, Gregory, Wang, Li, Wirthlin, Michael   +4 more
core   +1 more source

Single event upset studies on the APV25 front end readout chip [PDF]

, 2000
Bisello, D, Faccio, F, French, M, Fulcher, J R, Hall, G, Huhtinen, M, Jones, L, Noah, E, Paccagnella, A, Raymond, M, Wyss, J   +10 more
core   +1 more source