Results 111 to 120 of about 13,512 (161)

Detecting Single Event Upsets in Embedded Software

2018 IEEE 21st International Symposium on Real-Time Distributed Computing (ISORC), 2018
The past decade has seen explosive growth in the use of small satellites. Within this domain, there has been a growing trend to place more responsibility on the flight software (versus hardware) and an increasing adoption of consumer-grade microprocessors to satisfy this desire for increased processing capability while still minimizing size, weight ...
Robert G. Pettit IV, Aedan D. Pettit
openaire   +1 more source

Single-Event-Upset (SEU) Awareness in FPGA Routing

2007 44th ACM/IEEE Design Automation Conference, 2007
The majority of configuration bits affecting a design are devoted to FPGA routing configuration. We present a SEU-aware routing algorithm that provides significant reduction in bridging faults caused by SEUs. Depending on the routing architecture switches, for MCNC benchmarks, the number of care bits can be reduced between 13% and 19% on average with ...
Shahin Golshan, Elaheh Bozorgzadeh
openaire   +1 more source

Single event upset at gigahertz frequencies

IEEE Transactions on Nuclear Science, 1994
Single Event Upset (SEU) characteristics of a digital emitter coupled logic (ECL) device clocking at 0.5, 1, and 3.2 GHz and at temperatures of 5, 75, and 105/spl deg/ C are presented. The test technique is explained. Observations of two types of upsets, phase upsets at low Linear Energy Transfer (LETs) and amplitude upsets at high LETs are also ...
M. Shoga, K. Jobe, M. Glasgow, M. Bustamante, E. Smith, R. Koga   +5 more
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Single Event Upset: Experimental

1997
The discussion in this chapter centers around the major single event upset (SEU) simulation sources. Their importance lies in the fact that simulation methods are one of the few means by which microcircuit susceptibility to SEU can be measured. These sources and source types are few in number, principally because of the somewhat unusual properties of ...
George C. Messenger, Milton S. Ash
openaire   +1 more source

Single-event upset in the PowerPC750 microprocessor

IEEE Transactions on Nuclear Science, 2001
Proton and heavy ion upset susceptibility has been measured individually for six types of storage elements in an advanced commercial processor, the PowerPC750, from two manufacturers: Motorola and IBM. Data on interfering program malfunctions was also collected. Compared to earlier PPC603e results, the upset susceptibility has decreased somewhat.
G.M. Swift, F.F. Fannanesh, S.M. Guertin, F. Irom, D.G. Millward   +4 more
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Single event upset rates in space

IEEE Transactions on Nuclear Science, 1992
SEUs (single event upsets) in the CRRES (Combined Release and Radiation Effects Satellite) MEP (Microelectronic Package Space Experiment) showed a dramatic increase during a solar flare, the influence of the flare varied widely among device types, and a GaAs RAM (random access memory) showed a different response to the proton belts than some 51 RAMs ...
A. Campbell, P. McDonald, K. Ray
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Mechanisms Leading to Single Event Upset

IEEE Transactions on Nuclear Science, 1986
SRAM cell recovery time following a 140 MeV Krypton strike on a Sandia SRAM is modelled using a two-dimensional transient numerical simulator and circuit code. Strikes at both n- and p-channel "off" drains are investigated. Four principle results are obtained.
C. L. Axness, H. T. Weaver, J. S. Fu, R. Koga, W. A. Kolasinski   +4 more
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On single event upset error manifestation

1994
This paper addresses the problem of how faults in a radiation environment primarily manifest as errors in a complex device. Previous work in the area has focused on modelling the latching of transients. In this paper this modelling task is extended to the phenomenon of double soft errors. The first error manifestation of a single event upset (SEU) in a
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Single Event Upset Practice

1997
This chapter and Chapter 5 include a reprise of the discussion in the earlier chapters pertinent to these sections, and together with Chapter 5 present guidelines for use in practical applications. Besides understanding the basic tenets of the discipline of single event phenomena (SEP), it is felt important for the reader that they be transformed into ...
George C. Messenger, Milton S. Ash
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Anomalies due to single event upsets

28th Aerospace Sciences Meeting, 1990
The description of single event upsets (SEUs) in the spacecraft Anomalies Handbook is reviewed. The basic mechanism involved in SEUs is summarized and discussed in terms of circuit analysis. Calculation of SEU rate is analytically described and discussed. Departures from single step function dependence in the SEU rate is addressed.
P. Robinson, W. Lee, R. Aguero, S. Gabriel   +3 more
openaire   +1 more source