Results 131 to 140 of about 13,512 (161)

Single Event Upset Error Rates

1997
This chapter together with Chapter 8 provides the major share of the discussion on the practical aspects of single event upset (SEU). This includes formulas for computing SEU in various particle environments. Section 5.2 discusses SEU calculations for heavy-ion cosmic rays at geosynchronous altitudes and Section 5.3 for Van Allen belt protons.
George C. Messenger, Milton S. Ash
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Single event upset at ground level

IEEE Transactions on Nuclear Science, 1996
Ground level upsets have been observed in computer systems containing large amounts of random access memory (RAM). Atmospheric neutrons are most likely the major cause of the upsets based on measured data using the Weapons Neutron Research (WNR) neutron beam.
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Observation of single event upsets in analog microcircuits

IEEE Transactions on Nuclear Science, 1993
Selected analog devices were tested for heavy-ion-induced single event upset (SEU). The results of these tests are presented, likely upset mechanisms are discussed, and standards for the characterization of analog upsets are suggested. The OP-15 operational amplifier, which was found to be susceptible to SEU in the laboratory, has also experienced ...
R. Koga, S.D. Pinkerton, S.C. Moss, D.C. Mayer, S. LaLumondiere, S.J. Hansel, K.B. Crawford, W.R. Crain   +7 more
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Single Event Upset Hardening of Interconnects

2016
With advances in technology scaling, circuits are increasingly more sensitive to transients caused by Single Event particles. Hardening techniques for CMOS combinational logic have been developed to address the problems associated with Single Event Transients , but in these designs, SET coupling effects have been ignored.
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Investigation for Single-Event Upset in MSI Devices

IEEE Transactions on Nuclear Science, 1981
This paper describes the results of the first known test for cosmic-ray effects exclusively directed towards several MSI logic families containing flip-flops, since Binder et al postulated the explanation for anomalous bit flips in 1975. The test was performed as a result of a joint effort between the Jet Propulsion Laboratory and MIT Lincoln ...
J. P. Woods, D. K. Nichols, W. E. Price
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Single Event Upset Detection and Correction

10th International Conference on Information Technology (ICIT 2007), 2007
Jawar Singh, Jimson Mathew, Mohammad Hosseinabady, Dhiraj K. Pradhan   +3 more
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Pruning single event upset faults with petri nets

2009 10th Latin American Test Workshop, 2009
Dependability of embedded systems is becoming a serious concern even for mass-market systems. Usually, designs are verified by means of fault injection campaigns, but the length of a thorough test often collides with the severe requirements about design cycle times.
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Single event upsets in space

21st Aerospace Sciences Meeting, 1983
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Suggested Single Event Upset Figure of Merit

IEEE Transactions on Nuclear Science, 1983
E L Petersen
exaly  

SINGLE EVENT UPSETS IN MICROELECTRONICS

1991
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