Results 141 to 150 of about 13,512 (161)

Single Event Upset Measurements of Gaas E-JFET RAMS

IEEE Transactions on Nuclear Science, 1983
P Shapiro, A B Campbell, R Zuleeg
exaly  

Single event double-upset fully immune and transient pulse filterable latch design for nanoscale CMOS

Microelectronics Journal, 2017
Aibin Yan, Zhengfeng Huang, Yiming Ouyang   +2 more
exaly  

Single event upset (SEU) sensitivity dependence of linear integrated circuits (ICs) on bias conditions

IEEE Transactions on Nuclear Science, 1997
K B Crawford, W R Crain, S C Moss
exaly  

Prevention of Single Event Upsets in Microelectronics

1991
B. L. Bhuva, L. W. Massengill, S. E. Kerns, T. R. Weatherford, J. R. Hauser   +4 more
openaire   +1 more source

Basic mechanisms and modeling of single-event upset in digital microelectronics

IEEE Transactions on Nuclear Science, 2003
P E Dodd, L W Massengill
exaly  

Impact of Process Variations and Charge Sharing on the Single-Event-Upset Response of Flip-Flops

IEEE Transactions on Nuclear Science, 2011
B L Bhuva, L W Massengill, W T Holman
exaly  

Study Of Single-event-upsets In PAL16R8

1993 IEEE Radiation Effects Data Workshop, 2005
J. Barak, J. Levinson, A. Zentner, D. David, O. Even, M. Hass, D. Ilberg, Y. Lifshitz   +7 more
openaire   +1 more source

The Variability of Single Event Upset Rates in the Natural Environment

IEEE Transactions on Nuclear Science, 1983
James H Adams
exaly  

Single Event Upset cross sections at various data rates

IEEE Transactions on Nuclear Science, 1996
R A Reed, M A Carts, P W Marshall
exaly  

Heavy Ion and Proton-Induced Single Event Upset Characteristics of a 3-D NAND Flash Memory

IEEE Transactions on Nuclear Science, 2018
Dakai Chen, Edward P Wilcox, R Ladbury
exaly