Results 51 to 60 of about 312,838 (207)

Enhanced Radiation Hardness and Faster Front Ends for the Beetle Readout Chip [PDF]

, 2001
This paper summarizes the recent progress in the development of the 128 channel pipelined readout chip Beetle, which is intended for the silicon vertex detector, the inner tracker, the pile-up veto trigger and the RICH detectors of LHCb.
Bauer, C, Baumeister, D, Feuerstack-Raible, M, Harnew, N, Hofmann, W, Knöpfle, K T, Löchner, S, Schmelling, M, Sexauer, E, Smale, N J, Trunk, U, Trunk, U, Van Bakel, N, Van den Brand, J F J, Verkooijen, H   +14 more
core   +1 more source

Cosmic ray environment model for Earth orbit [PDF]

A set of computer codes, which include the effects of the Earth's magnetic field, used to predict the cosmic ray environment (atomic numbers 1 through 28) for a spacecraft in a near-Earth orbit is described.
Edmonds, L.
core   +1 more source

Understanding radiation effects in SRAM-based field programmable gate arrays for implementing instrumentation and control systems of nuclear power plants

Nuclear Engineering and Technology, 2017
Field programmable gate arrays (FPGAs) are getting more attention in safety-related and safety-critical application development of nuclear power plant instrumentation and control systems.
T.S. Nidhin, Anindya Bhattacharyya, R.P. Behera, T. Jayanthi, K. Velusamy   +4 more
doaj   +1 more source

Heavy Ion Irradiation Fluence Dependence for Single-Event Upsets of NAND Flash Memory [PDF]

We investigated the single-event effect (SEE) susceptibility of the Micron 16 nm NAND flash, and found the single-event upset (SEU) cross section varied inversely with fluence. The SEU cross section decreased with increasing fluence.
Chen, Dakai, Kim, Hak, LaBel, Kenneth, Ladbury, Raymond, Phan, Anthony, Seidleck, Christina, Wilcox, Edward   +6 more
core   +1 more source

SEE Test and Data Analysis for Complex FPGA Systems [PDF]

Critical space applications require knowledge of single event upset (SEU) susceptibility (mission survivability). Generic SEU test and analysis techniques do not provide adequate data for survivability analysis.
Berg, Melanie, Campola, Michael
core   +1 more source

A Soft Error Self-Resilience Radiation-Hardened 14T SRAM for Aerospace Applications

IEEE Access
Various charged particles in space threaten memory circuit integrity and dependability, including photons, alpha particles, and high-energy ions outside the Low Earth Orbit region.
Guguloth Anjaneyulu, Asisa Kumar Panigrahy, Mukku Pavan Kumar, Shams Ul Haq, Abdolreza Darabi, Erfan Abbasian, Priyanka Sharma, M. Durga Prakash   +7 more
doaj   +1 more source

Interplanetary Particle Environment. Proceedings of a Conference [PDF]

A workshop entitled the Interplanetary Charged Particle Environment was held at the Jet Propulsion Laboratory (JPL) on March 16 and 17, 1987. The purpose of the Workshop was to define the environment that will be seen by spacecraft operating in the 1990s.
Feynman, Joan, Gabriel, Stephen
core   +1 more source

Radiation tolerant combinational logic cell [PDF]

, 2009
A system has a reduced sensitivity to Single Event Upset and/or Single Event Transient(s) compared to traditional logic devices. In a particular embodiment, the system includes an input, a logic block, a bias stage, a state machine, and an output.
Gambles, Jody W., Maki, Gary R., Whitaker, Sterling   +2 more
core   +1 more source

Randomness in Competitions [PDF]

, 2012
We study the effects of randomness on competitions based on an elementary random process in which there is a finite probability that a weaker team upsets a stronger team.
Ben-Naim, E., Hengartner, N. W., Redner, S., Vazquez, F.   +3 more
core   +2 more sources

Study on Single Event Upset and Mitigation Technique in JLTFET-Based 6T SRAM Cell

Journal of Electrical and Computer Engineering
The effect of single event transient (SET) on 6T SRAM cell employing a 20 nm silicon-based junctionless tunneling field effect transistor (JLTFET) is explored for the first time. JLTFET-based SRAM circuit is designed using the look up table-based Verilog
Aishwarya K, Lakshmi B
doaj   +1 more source