Results 31 to 40 of about 7,404,371 (262)

Dynamic Robust Single-Event Upset Simulator

Journal of Aerospace Information Systems, 2018
This paper presents the dynamic robust single-event upset simulator, which is a novel framework for fault injection on hardware (via onchip debugging) and simulation testbeds (via the Simics® full-...
Edward Carlisle, Alan D. George
openaire   +2 more sources

Single event upset and mitigation technique in JLTFET based RF mixer

Results in Engineering
This work deals with the study of single event effect (SEE) on RF mixer along with the mitigation technique. A 20 nm independent gate Junctionless Tunnel FET JLTFET (IGJLTFET) was first designed and based on its Id-Vg characteristics; RF mixer circuit ...
Aishwarya K, Lakshmi B
doaj   +1 more source

Estimation of SEU Threshold Energy from Kitsat-1 Data Using AP-8 Model [PDF]

Journal of Astronomy and Space Sciences, 2001
KITSAT-1, launched in 1992, passes through Inner Van Allen Radiation Belt in which high energy protons cause single event upsets(SEUs) in the main memory of KITSAT-1 OBC(On-Board Computer)186.
Sung-Joon Kim, Young Hoon Shin, Sung Soo Kim, Kyoung Wook Min   +3 more
doaj  

Social Functioning Within the First Years After Pediatric Brain Tumor Diagnosis and the Relationship With Family Psychosocial Risk

Pediatric Blood &Cancer, EarlyView.
ABSTRACT Background Survivors of pediatric brain tumors (PBTs) can experience long‐term social difficulties, impacting quality of life. Beyond medical and environmental factors, family psychosocial risk may play a role in social outcomes by shaping the caregiving environment and may provide intervention options.
Renske H. Houben, Marisa H. Huisman, Martha A. Grootenhuis, Femke K. Aarsen, Marita Partanen   +4 more
wiley   +1 more source

BRAM implementation of a single-event upset sensor for adaptive single-event effect mitigation in reconfigurable FPGAs

, 2022
S.1-8In this paper, we study the performance of a Block RAM (BRAM)-based embedded radiation sensor for adaptive single-event effect mitigation in FPGAs. To achieve this, we designed custom BRAM wrappers to extend the Xilinx BRAM macros with scrubbing and
Mengs, P., Heuberger, A., Glein, R., Wansch, R., Rittner, F.   +4 more
core   +1 more source

A Machine Learning Approach to Predicting Single Event Upsets

CoRR, 2023
A single event upset (SEU) is a critical soft error that occurs in semiconductor devices on exposure to ionising particles from space environments. SEUs cause bit flips in the memory component of semiconductors. This creates a multitude of safety hazards as stored information becomes less reliable.
Archit Gupta, Chong Yock Eng, Deon Lim Meng Wee, Rashna Analia Ahmed, See Min Sim   +4 more
openaire   +2 more sources

Design of linear feedback shift register with single event upset resistance

Xibei Gongye Daxue Xuebao
The rapid development of China's aerospace industry has rendered the radiation-hardened integrated circuit design critically importance, especially for spacecraft chips requiring protection against cosmic high-energy particle effects.
TIAN Jiahao, CAO Bei, SUN Hongyue, ZHANG Tienan   +3 more
doaj   +1 more source

Retrospective Analysis of Donor Lymphocyte Infusions in Pediatric Patients With Mixed Chimerism After Hematopoietic Stem Cell Transplantation

Pediatric Blood &Cancer, EarlyView.
ABSTRACT Background Allogeneic hematopoietic stem cell transplantation (alloHSCT) is an essential therapy for several malignant and nonmalignant diseases, but relapse and graft loss remain the principal threats to its success. Routine monitoring of chimerism and minimal residual disease (MRD) enables early detection of imminent recurrence and guides ...
Carmen Junk, Sebastian Michaelis, Michaela Döring, Thomas Eichholz, Ursula Holzer, Martin Ebinger, Tim Flaadt, Rupert Handgretinger, Peter Lang, Jan Frederic Weller, Markus Mezger   +10 more
wiley   +1 more source

On the design of two single event tolerant slave latches for scan delay testing [PDF]

, 2012
This paper proposes two new slave latches for improving the Single Event Upset (SEU) tolerance of a flip- flop in scan delay testing. The two proposed slave latches utilize additional circuitry to increase the critical charge of the flip-flop compared to
Lu Y, Pontarelli S, Lombardi F, Ottavi M
core   +2 more sources

Soft-Error-Resilient Static Random Access Memory with Enhanced Write Ability for Radiation Environments

Micromachines
As semiconductor technologies advance, SRAM cells deployed in space systems face heightened sensitivity to radiation-induced soft errors. In conventional 6T SRAM, when high-energy particles strike sensitive nodes, single-event upsets (SEUs) may occur ...
Se-Yeon Park, Eun Gyo Jeong, Sung-Hun Jo
doaj   +1 more source