IEEE Access, 2019 A fault-tolerant hardening-by-design frequency divider has been proposed for clock and data recovery in a 28-nm CMOS process. By means of the mandatory updating mechanism, the proposed divider can update the state of the D flip-flops from an error state ...
Hengzhou Yuan +5 more
doaj +1 more source
Heavy ion induced Single Event Phenomena (SEP) data for semiconductor devices from engineering testing [PDF]
The accumulation of JPL data on Single Event Phenomena (SEP), from 1979 to August 1986, is presented in full report format. It is expected that every two years a supplement report will be issued for the follow-on period. This data for 135 devices expands
Coss, James R. +4 more
core +1 more source
Design and Comparison of SEU Tolerant 10T Memory Cell for Radiation Environment Applications
EAI Endorsed Transactions on Energy WebSingle event upsets (SEUs), which are caused by radiation particles, have emerged as a significant concern in aircraft applications. Soft mistakes, which manifest as corruption of data in memory chips and circuit faults, are mostly produced by SEUs. The
P Mangayarkarasi +2 more
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Microsemi RTG4 Rev C Field Programmable Gate Array Single Event Effects (SEE) Heavy-Ion Test Report [PDF]
The goal of this study was to perform an independent investigation of single event destructive and transient susceptibility of the Microsemi RTG4 device. The devices under test were the Microsemi RTG4 field programmable gate array (FPGA) Rev C.
Berg, Melanie D. +6 more
core +1 more source
Monte Carlo Simulation of Proton Upsets in Xilinx Virtex-II FPGA Using a Position Dependent Q(sub crit) with PROPSET [PDF]
, 2006 This paper describes new software simulation code for predicting single event upset data from measured heavy ion data, using methods, code, and algorithms already reported in the open literature.
Foster, Charles C. +2 more
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Reprogrammable field programmable gate array with integrated system for mitigating effects of single event upsets [PDF]
, 2010 An integrated system mitigates the effects of a single event upset (SEU) on a reprogrammable field programmable gate array (RFPGA). The system includes (i) a RFPGA having an internal configuration memory, and (ii) a memory for storing a configuration ...
Herath, Jeffrey A., Ng, Tak-kwong
core +1 more source
Reliability of LEON3 Processor’s Program Counter Against SEU, MBU, and SET Fault Injection
CryptographyThis paper presents a comprehensive register transfer-level (RTL) fault injection study targeting the program counter (PC) of the LEON3 processor, a SPARC V8-compliant core widely used in safety-critical and radiation-prone embedded applications.
Afef Kchaou +3 more
doaj +1 more source
Design and qualification of the SEU/TD Radiation Monitor chip [PDF]
This report describes the design, fabrication, and testing of the Single-Event Upset/Total Dose (SEU/TD) Radiation Monitor chip. The Radiation Monitor is scheduled to fly on the Mid-Course Space Experiment Satellite (MSX).
Blaes, Brent R. +4 more
core +1 more source
Compendium of Current Single Event Effects for Candidate Spacecraft Electronics for NASA [PDF]
NASA spacecraft are subjected to a harsh space environment that includes exposure to various types of ionizing radiation. The performance of electronic devices in a space radiation environment are often limited by their susceptibility to single event ...
Berg, Melanie D. +8 more
core +1 more source
Non Radiation Hardened Microprocessors in Spaced Based Remote Sensing Systems [PDF]
, 2006 The CALIPSO (Cloud-Aerosol Lidar and Infrared Pathfinder Satellite Observations) mission is a comprehensive suite of active and passive sensors including a 20Hz 230mj Nd:YAG lidar, a visible wavelength Earth-looking camera and an imaging infrared ...
Decoursey, Robert J. +2 more
core +1 more source