Radiation-Hardened 16T SRAM Cell with Improved Read and Write Stability for Space Applications
Applied SciencesThe critical charge of sensitive nodes decreases as transistors scale down with the advancement of CMOS technology, making SRAM cells more susceptible to soft errors in the space industry.
Jong-Yeob Oh, Sung-Hun Jo
doaj +1 more source
Microsemi RTG4 Rev C Field Programmable Gate Array Single Event Effects (SEE) Heavy-Ion Test Report [PDF]
The goal of this study was to perform an independent investigation of single event destructive and transient susceptibility of the Microsemi RTG4 device. The devices under test were the Microsemi RTG4 field programmable gate array (FPGA) Rev C.
Berg, Melanie D. +6 more
core +1 more source
A Comprehensive Methodology for Soft Error Rate (SER) Reduction in Clock Distribution Network
ChipsSingle Event Transients (SETs) in clock-distribution networks are a major source of soft errors in synchronous systems. We present a practical framework that assesses SET risk early in the design cycle, before layout and parasitics, using a Vulnerability
Jorge Johanny Saenz-Noval +2 more
doaj +1 more source
Heavy ion induced Single Event Phenomena (SEP) data for semiconductor devices from engineering testing [PDF]
The accumulation of JPL data on Single Event Phenomena (SEP), from 1979 to August 1986, is presented in full report format. It is expected that every two years a supplement report will be issued for the follow-on period. This data for 135 devices expands
Coss, James R. +4 more
core +1 more source
From vulnerability to robustness: Radiation-hard isolation for BPR-enabled stacked nanosheet CFETs
Nuclear Engineering and TechnologyThe integration of Buried Power Rail (BPR) and Complementary FET (CFET) technologies is a promising way to improve power efficiency and circuit density in advanced logic devices.
Dongwook Kim +4 more
doaj +1 more source
Dynamic partial reconfiguration scheme for fault-tolerant FFT processor based on FPGA
The Journal of Engineering, 2019 The fast Fourier transform FFT processor is an important part of the space real-time signal processing system based on field programmable gate array (FPGA).
Xin Wei, Yi Z Xie, Yu Xie, He Chen
doaj +1 more source
The physics of a single-event upset in integrated circuits: A review and critique of analytical models for charge collection [PDF]
When an energetic particle (kinetic energy 0.5 MeV) originating from a radioactive decay or a cosmic ray transverse the active regions of semiconductor devices used in integrated circuit (IC) chips, it leaves along its track a high density electron hole
Vonroos, O., Zoutendyk, J.
core +1 more source
Compendium of Current Single Event Effects for Candidate Spacecraft Electronics for NASA [PDF]
NASA spacecraft are subjected to a harsh space environment that includes exposure to various types of ionizing radiation. The performance of electronic devices in a space radiation environment are often limited by their susceptibility to single event ...
Berg, Melanie D. +8 more
core +1 more source
RHLP-18T: A Radiation-Hardened 18T SRAM with Enhanced Read Stability and Low Power Consumption
Applied SciencesElectronic equipment in space is constantly exposed to high-energy particles, which can induce Single Event Upsets (SEUs) in memory components, threatening system reliability.
Han-Gyeol Kim, Sung-Hun Jo
doaj +1 more source
NEW MATERIAL FOR ELIMINATING LINEAR ENERGY TRANSFER SENSITIVITIES IN DEEPLY SCALED CMOS TECHNOLOGIES SRAM CELLS [PDF]
, 2010 As technology scales deep in submicron regime, CMOS SRAM memories have become increasingly sensitive to Single-Event Upset sensitivity. Key technological factors that impact Single-Event Upset sensitivity are gate length, gate and drain areas and the ...
Kanyogoro, Esau Nderitu
core