Results 101 to 110 of about 16,144 (237)

Single Event Upset Study of 22 nm Fully Depleted Silicon-on-Insulator Static Random Access Memory with Charge Sharing Effect. [PDF]

Micromachines (Basel), 2023
Yin C, Gao T, Wei H, Chen Y, Liu H.
europepmc   +1 more source

NASA Electronic Parts and Packaging (NEPP) Field Programmable Gate Array (FPGA) Single Event Effects (SEE) Test Guideline Update [PDF]

The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic versus mission specific device evaluation, single event latch-up (SEL) test and analysis, SEE response visibility enhancement during radiation testing ...
Berg, Melanie D., LaBel, Kenneth A.
core   +1 more source

Enhancement of Deep Neural Network Recognition on MPSoC with Single Event Upset. [PDF]

Micromachines (Basel), 2023
Yang W, Song W, Guo Y, Li Y, He C, Wu L, Wang B, Liu H, Shi G.   +8 more
europepmc   +1 more source

Atmospheric neutron inducing single event effects on AI chips manufacturing with 8 nm FinFET

Nuclear Engineering and Technology
--With the rapid advancement of artificial intelligence (AI) chips in diverse applications, single event effects (SEE) caused by high energy particles in ambient environment have emerged as a critical concern.
Yonghong Li, Jianan Tong, Weitao Yang, Zhiliang Hu, Lihua Mo, Tianjiao Liang, Chaohui He, Jinghui Lan   +7 more
doaj   +1 more source

A multi-node-upset-resilient 14T SRAM with high read stability for space applications

Nuclear Engineering and Technology
This paper proposes a voltage-booster read-decoupled radiation-hardened 14T (BDRH14T) SRAM cell. In harsh environments such as space, radiation can flip the stored data in memory cells, resulting in soft errors, including single-event upset (SEU) and ...
Sung-Jun Lim, Sung-Hun Jo
doaj   +1 more source

A High-Reliability 12T SRAM Radiation-Hardened Cell for Aerospace Applications. [PDF]

Micromachines (Basel), 2023
Yao R, Lv H, Zhang Y, Chen X, Zhang Y, Liu X, Bai G.   +6 more
europepmc   +1 more source

Radiation Mitigation and Power Optimization Design Tools for Reconfigurable Hardware in Orbit [PDF]

The Reconfigurable Hardware in Orbit (RHinO)project is focused on creating a set of design tools that facilitate and automate design techniques for reconfigurable computing in space, using SRAM-based field-programmable-gate-array (FPGA) technology.
French, Matthew, Graham, Paul, Larchev, Gregory, Wang, Li, Wirthlin, Michael   +4 more
core   +1 more source

NASA Electronic Parts and Packaging Field Programmable Gate Array Single Event Effects Test Guideline Update [PDF]

The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic versus mission specific device evaluation, single event latch-up (SEL) test and analysis, SEE response visibility enhancement during radiation testing ...
Berg, Melanie D., LaBel, Kenneth A.
core   +1 more source

The effects of high energy particles on planetary missions [PDF]

Researchers review the background and motivation for the detailed study of the variability and uncertainty of the particle environment from a space systems planning perspective. The engineering concern raised by each environment is emphasized rather than
Robinson, Paul A., Jr.
core   +1 more source

A Radiation-Hardened Triple Modular Redundancy Design Based on Spin-Transfer Torque Magnetic Tunnel Junction Devices

Applied Sciences
Integrated circuits suffer severe deterioration due to single-event upsets (SEUs) in irradiated environments. Spin-transfer torque magnetic random-access memory (STT-MRAM) appears to be a promising candidate for next-generation memory as it shows ...
Shubin Zhang, Peifang Dai, Ning Li, Yanbo Chen   +3 more
doaj   +1 more source