Results 111 to 120 of about 16,144 (237)
Radiation-Hardened 20T SRAM with Read and Write Optimization for Space Applications
With continued CMOS scaling, transistor miniaturization has significantly raised SRAM integration density while lowering the critical charge (Qc), increasing cell vulnerability to spaceborne high-energy particles.
Kon-Woo Kim, Eun Gyo Jeong, Sung-Hun Jo
doaj +1 more source
Cre Experiment on KITSAT-1 [PDF]
The Cosmic Ray Experiment (CRE) is one of the modules flown on board the KITSAT-1 satellite and consists of two sub-systems: the Total Dose Experiment (TDE) and the Cosmic Particle Experiment (CPE).
Young-Hoon Shin +3 more
doaj
A ReRAM-Based Non-Volatile and Radiation-Hardened Latch Design. [PDF]
Yan A +7 more
europepmc +1 more source
Solar and Galactic Cosmic Rays observed by SOHO
Both the Cosmic Ray Flux (CRF) and Solar Energetic Particles (SEPs) have left an imprint on SOHO technical systems. While the solar array efficiency degraded irreversibly down to ~77% of its original level over roughly 1 1/2 solar cycles, Single Event ...
Curdt, Werner, Fleck, Bernhard
core
Analytical and Numerical Investigation of Nanowire Transistor X-ray Detector. [PDF]
Ellakany A +6 more
europepmc +1 more source
Working group written presentation: Trapped radiation effects [PDF]
The results of the Trapped Radiation Effects Panel for the Space Environmental Effects on Materials Workshop are presented. The needs of the space community for new data regarding effects of the space environment on materials, including electronics are ...
Coulter, D. +9 more
core +1 more source
The Effectiveness of TAG or Guard-Gates in SET Suppression Using Delay and Dual-Rail Configurations at 0.35 microns [PDF]
Design options for decreasing the susceptibility of integrated circuits to Single Event Upset (SEU) fall into two categories: (1) increasing the critical charge to cause an upset at a particular node, and (2) employing redundancy to mask or correct ...
Balasubramanian, Anupama +5 more
core +1 more source
Nuclear fragmentation studies for microelectronic application [PDF]
A formalism for target fragment transport is presented with application to energy loss spectra in thin silicon devices. Predicted results are compared to experiments with the surface barrier detectors of McNulty et al.
Buck, Warren W. +3 more
core +1 more source
Effect of Total Dose Irradiation on Parasitic BJT in 130 nm PDSOI MOSFETs. [PDF]
Jia Y, Zhang Z, Bi D, Hu Z, Zou S.
europepmc +1 more source
Energy and angular dependence of single event upsets in ESA SEU Monitor
Yinhong Luo +4 more
openalex +1 more source

