Results 111 to 120 of about 16,144 (237)

Radiation-Hardened 20T SRAM with Read and Write Optimization for Space Applications

open access: yesApplied Sciences
With continued CMOS scaling, transistor miniaturization has significantly raised SRAM integration density while lowering the critical charge (Qc), increasing cell vulnerability to spaceborne high-energy particles.
Kon-Woo Kim, Eun Gyo Jeong, Sung-Hun Jo
doaj   +1 more source

Cre Experiment on KITSAT-1 [PDF]

open access: yesJournal of Astronomy and Space Sciences, 1994
The Cosmic Ray Experiment (CRE) is one of the modules flown on board the KITSAT-1 satellite and consists of two sub-systems: the Total Dose Experiment (TDE) and the Cosmic Particle Experiment (CPE).
Young-Hoon Shin   +3 more
doaj  

A ReRAM-Based Non-Volatile and Radiation-Hardened Latch Design. [PDF]

open access: yesMicromachines (Basel), 2022
Yan A   +7 more
europepmc   +1 more source

Solar and Galactic Cosmic Rays observed by SOHO

open access: yes, 2015
Both the Cosmic Ray Flux (CRF) and Solar Energetic Particles (SEPs) have left an imprint on SOHO technical systems. While the solar array efficiency degraded irreversibly down to ~77% of its original level over roughly 1 1/2 solar cycles, Single Event ...
Curdt, Werner, Fleck, Bernhard
core  

Analytical and Numerical Investigation of Nanowire Transistor X-ray Detector. [PDF]

open access: yesMaterials (Basel), 2023
Ellakany A   +6 more
europepmc   +1 more source

Working group written presentation: Trapped radiation effects [PDF]

open access: yes
The results of the Trapped Radiation Effects Panel for the Space Environmental Effects on Materials Workshop are presented. The needs of the space community for new data regarding effects of the space environment on materials, including electronics are ...
Coulter, D.   +9 more
core   +1 more source

The Effectiveness of TAG or Guard-Gates in SET Suppression Using Delay and Dual-Rail Configurations at 0.35 microns [PDF]

open access: yes
Design options for decreasing the susceptibility of integrated circuits to Single Event Upset (SEU) fall into two categories: (1) increasing the critical charge to cause an upset at a particular node, and (2) employing redundancy to mask or correct ...
Balasubramanian, Anupama   +5 more
core   +1 more source

Nuclear fragmentation studies for microelectronic application [PDF]

open access: yes
A formalism for target fragment transport is presented with application to energy loss spectra in thin silicon devices. Predicted results are compared to experiments with the surface barrier detectors of McNulty et al.
Buck, Warren W.   +3 more
core   +1 more source

Energy and angular dependence of single event upsets in ESA SEU Monitor

open access: hybrid, 2016
Yinhong Luo   +4 more
openalex   +1 more source

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