Results 21 to 30 of about 253 (176)
The single event effect caused by space heavy ion radiation is one of the important factors affecting the safety and operation of spacecraft on orbit.
Zhang Binquan +10 more
doaj +1 more source
Double Node Upset Immune RHBD-14T SRAM Cell for Space and Satellite Applications
Deep sub-micron memory devices play a crucial role in space electronic applications due to their susceptibility to single-event upset and double-node upset types of soft errors. When a charged particle from space hit a scaled memory circuit, the critical
Pavan Kumar Mukku, Rohit Lorenzo
doaj +1 more source
Dynamic Partial based Single Event Upset (SEU) Injection Platform on FPGA
SRAM based FPGAs are attracting considerable interest especially in aerospace applications due to their high reconfigurability, low cost and availability. However, these devices are strongly susceptible to space radiation effects which are able to cause unwanted single event upsets (SEUs) in the configuration memory.
Karim Mohammadi, Reza OmidiGosheblagh
openaire +1 more source
Low Density Parity Check (LDPC) codes are used in 5G systems for traffic channels due to their excellent error correction capability for long sequences, and the Min-Sum algorithm is widely applied in practical implementations of LDPC decoders due to its low complexity.
Zhen Gao +4 more
openaire +2 more sources
Radiation Hardened NULL Convention Logic Asynchronous Circuit Design
This paper proposes a radiation hardened NULL Convention Logic (NCL) architecture that can recover from a single event latchup (SEL) or single event upset (SEU) fault without deadlock or any data loss.
Liang Zhou, Scott C. Smith, Jia Di
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Energy and angular dependence of single event upsets in ESA SEU Monitor
The new generation ESA SEU Monitor is first applied to beam verification of Beijing HI-13 Tandem accelerator according to the popularization need of Europe Space Agency and at the desire of contrast of domestic acceleraor with international accelerator.
null Luo Yin-Hong +4 more
openaire +1 more source
With the wide application of FPGA(field programmable gate array) based on the SRAM(static randomaccess memory) in the aerospace field, the probability of SEU(single event upset) increases gradually while the FPGAs are exposed in irradiation environment ...
XIE Da;DONG Yiping;WANG Lan;CAO Jinde;GUO Junjie
doaj +1 more source
In space environments, radiation particles affect the stored values of SRAM cells, and these effects, such as single-event upsets (SEUs) and single-event multiple-node upsets (SEMNUs), pose a threat to the reliability of systems used in the space ...
Hong-Geun Park, Sung-Hun Jo
doaj +1 more source
Computer systems onboard FORMOSAT-2 (F2) and FORMOSAT-3/COSMIC (F3/C) satellites often register abnormal signatures which are recorded as automatic reconfiguration orders (ARO) in F2, and reboot/reset (RBS) in F3/C.
Tsung-Ping Lee +7 more
doaj +1 more source
Field programmable gate arrays (FPGAs) are getting more attention in safety-related and safety-critical application development of nuclear power plant instrumentation and control systems.
T.S. Nidhin +4 more
doaj +1 more source

