Results 31 to 40 of about 16,144 (237)

Measurements of Single Event Upset in ATLAS IBL [PDF]

open access: yesJournal of Instrumentation, 2020
Effects of Single Event Upsets (SEU) and Single Event Transients (SET) are studied in the FE-I4B chip of the innermost layer of the ATLAS pixel system. SEU/SET affect the FE-I4B Global Registers as well as the settings for the individual pixels, causing,
G. Balbi   +84 more
semanticscholar   +1 more source

Low-Power Radiation-Hardened Static Random Access Memory with Enhanced Read Stability for Space Applications

open access: yesApplied Sciences
In space environments, radiation particles affect the stored values of SRAM cells, and these effects, such as single-event upsets (SEUs) and single-event multiple-node upsets (SEMNUs), pose a threat to the reliability of systems used in the space ...
Hong-Geun Park, Sung-Hun Jo
doaj   +1 more source

Abnormal Signatures Recorded by FORMOSAT-2 and FORMOSAT-3 over South Atlantic Anomaly and Polar Region

open access: yesTerrestrial, Atmospheric and Oceanic Sciences, 2014
Computer systems onboard FORMOSAT-2 (F2) and FORMOSAT-3/COSMIC (F3/C) satellites often register abnormal signatures which are recorded as automatic reconfiguration orders (ARO) in F2, and reboot/reset (RBS) in F3/C.
Tsung-Ping Lee   +7 more
doaj   +1 more source

Understanding radiation effects in SRAM-based field programmable gate arrays for implementing instrumentation and control systems of nuclear power plants

open access: yesNuclear Engineering and Technology, 2017
Field programmable gate arrays (FPGAs) are getting more attention in safety-related and safety-critical application development of nuclear power plant instrumentation and control systems.
T.S. Nidhin   +4 more
doaj   +1 more source

A computational analysis on the role of low energy proton-induced single event upset in a 65 nm CMOS SRAM [PDF]

open access: yesمجله علوم و فنون هسته‌ای, 2020
This investigation is a computational analysis of a kind of radiation effect on electronic devices, known as the single event upset (SEU) with the Geant4 toolkit.
M. Soleimaninia,, G. Raisali, A. Moslehi
doaj   +1 more source

Enhanced Radiation Hardness and Faster Front Ends for the Beetle Readout Chip [PDF]

open access: yes, 2001
This paper summarizes the recent progress in the development of the 128 channel pipelined readout chip Beetle, which is intended for the silicon vertex detector, the inner tracker, the pile-up veto trigger and the RICH detectors of LHCb.
Bauer, C   +14 more
core   +1 more source

NI Based System for Seu Testing of Memory Chips for Avionics

open access: yesMATEC Web of Conferences, 2016
This paper presents the results of implementation of National Instrument based system for Single Event Upset testing of memory chips into neutron generator experimental facility, which used for SEU tests for avionics purposes. Basic SEU testing algorithm
Boruzdina Anna   +3 more
doaj   +1 more source

When Single Event Upset Meets Deep Neural Networks: Observations, Explorations, and Remedies [PDF]

open access: yesAsia and South Pacific Design Automation Conference, 2019
Deep Neural Network has proved its potential in various perception tasks and hence become an appealing option for interpretation and data processing in security sensitive systems.
Zheyu Yan   +5 more
semanticscholar   +1 more source

Harnessing Natural Compounds in Psoriasis: Targeting Cellular Pathways for Effective Therapy

open access: yesPhytotherapy Research, EarlyView.
Natural compounds act on key cellular pathways in psoriasis by suppressing keratinocyte hyperproliferation, modulating Th17/IL‐17‐mediated immune responses, and reducing oxidative stress. These multi‐target effects highlight their potential as safer adjunctive therapies alongside conventional treatments.
Hye Jin Lee   +9 more
wiley   +1 more source

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