Results 61 to 70 of about 253 (176)

Association Between Neutrophil‐to‐Lymphocyte Ratio and Glycemic Control in Type 2 Diabetes Mellitus: An Updated Systematic Review and Meta‐Analysis

Health Science Reports, Volume 9, Issue 2, February 2026.
ABSTRACT Background Type 2 diabetes mellitus (T2DM) is increasingly seen as a chronic inflammatory state, with the neutrophil‐to‐lymphocyte ratio (NLR) studied as a new biomarker of systemic inflammation. Evidence links NLR to glycemic control, but its consistency and strength vary.
Maryam Mohammadi, Parsa Panahiyan, Faizan Bashir, Shayesteh Haghighi, Sara Ahmadi, Ensiyeh Olama, Yasaman Ghodsi Boushehri, Elnaz Olama, Alaleh Alizadeh, Zahra Sadat Hoseini Nasab, Mahdyieh Naziri, Niloofar Deravi, Neda Fakhrghasemi, Danyal Yarahmadi   +13 more
wiley   +1 more source

Single‐Chain Anti‐IL‐1β Antibody Carried by Outer Membrane Vesicles of Bacteroides fragilis Alleviates Tubular Inflammation in Chronic Kidney Disease

Journal of Extracellular Vesicles, Volume 15, Issue 2, February 2026.
Engineered Bacteroides fragilis outer membrane vesicles carrying anti‐IL‐1β scFv and kidney‐targeting peptides alleviate renal inflammation and injury in CKD mouse models via precise delivery and NF‐κB inhibition. ABSTRACT Microinflammation is a key driver of chronic kidney disease (CKD) progression, with interleukin‐1β (IL‐1β) playing a pivotal role ...
Liang Li, Xue Qi Li, Jia Xiu Zhang, Qin Yi Wu, Pei Pei Chen, Xiong Zhong Ruan, Kun Ling Ma   +6 more
wiley   +1 more source

Enhancing SEU tolerance efficacy in advanced FinFET FPGA devices using system-level fine-grained spatial redundancy techniques

Nuclear Engineering and Technology
This paper investigates the Single Event Upset (SEU) sensitivity, system-level hardening effectiveness, and potential applications of high-performance 16 nm Field Programmable Gate Arrays (FPGAs) in radiation environments.
Chang Cai, Hong-Jie Zeng, Ze-Qi Huang, Xue-Zhi Zheng, Yi Sun, Jing Zhang, Min-Chi Hu, Han-Tao Jing, Zhi-Xin Tan, Rui-Rui Fan, Jun Ge, Shu-Sheng Pan   +11 more
doaj   +1 more source

USING THE SOCHI STAND TO CONFIRM THE IMMATIBILITY OF THE INTEGRATED CIRCUIT

Безопасность информационных технологий
The paper analyzes the possible to apply of the SOCHI stand for the purpose of controlling the immutability of the chip`s topology in order trust (in reliable and safe operation).
Dmitry V. Bobrovsky, Ivan I. Shvetsov-Shilovskiy, Alexander I. Chumakov, Sergey A. Soloviev, Evgeny M. Syresin, Alexei A. Slivin, Georgii A. Filatov   +6 more
doaj   +1 more source

Radiation-Hardened 16T SRAM Cell with Improved Read and Write Stability for Space Applications

Applied Sciences
The critical charge of sensitive nodes decreases as transistors scale down with the advancement of CMOS technology, making SRAM cells more susceptible to soft errors in the space industry.
Jong-Yeob Oh, Sung-Hun Jo
doaj   +1 more source

A Comprehensive Methodology for Soft Error Rate (SER) Reduction in Clock Distribution Network

Chips
Single Event Transients (SETs) in clock-distribution networks are a major source of soft errors in synchronous systems. We present a practical framework that assesses SET risk early in the design cycle, before layout and parasitics, using a Vulnerability
Jorge Johanny Saenz-Noval, Umberto Gatti, Cristiano Calligaro   +2 more
doaj   +1 more source

From vulnerability to robustness: Radiation-hard isolation for BPR-enabled stacked nanosheet CFETs

Nuclear Engineering and Technology
The integration of Buried Power Rail (BPR) and Complementary FET (CFET) technologies is a promising way to improve power efficiency and circuit density in advanced logic devices.
Dongwook Kim, Hanggyo Jung, Jimyeong Lee, Seungkyu Kim, Jongwook Jeon   +4 more
doaj   +1 more source

Dynamic partial reconfiguration scheme for fault-tolerant FFT processor based on FPGA

The Journal of Engineering, 2019
The fast Fourier transform FFT processor is an important part of the space real-time signal processing system based on field programmable gate array (FPGA).
Xin Wei, Yi Z Xie, Yu Xie, He Chen
doaj   +1 more source

RHLP-18T: A Radiation-Hardened 18T SRAM with Enhanced Read Stability and Low Power Consumption

Applied Sciences
Electronic equipment in space is constantly exposed to high-energy particles, which can induce Single Event Upsets (SEUs) in memory components, threatening system reliability.
Han-Gyeol Kim, Sung-Hun Jo
doaj   +1 more source

Single Event Upset Study of 22 nm Fully Depleted Silicon-on-Insulator Static Random Access Memory with Charge Sharing Effect. [PDF]

Micromachines (Basel), 2023
Yin C, Gao T, Wei H, Chen Y, Liu H.
europepmc   +1 more source