Results 71 to 80 of about 16,144 (237)

Validation of a software dependability tool via fault injection experiments [PDF]

, 2001
Presents the validation of the strategies employed in the RECCO tool to analyze a C/C++ software; the RECCO compiler scans C/C++ source code to extract information about the significance of the variables that populate the program and the code structure ...
Benso, Alfredo, Di Carlo, Stefano, Di Natale, Giorgio, Prinetto, Paolo Ernesto, Tagliaferri, Luca   +4 more
core   +1 more source

Life history induces markedly divergent insect responses to habitat loss

Journal of Animal Ecology, Volume 95, Issue 1, Page 54-64, January 2026.
This study pioneers the use of deep learning to rapidly assess over 22,000 Amazonian insects, revealing life history‐dependent winners and losers from forest loss. It shows that terrestrial insects decline while aquatic insects thrive, with body size influencing dispersal, offering key insights for biodiversity conservation in tropical fragmented ...
Lucas F. Colares, Carlos A. Peres, Cristian S. Dambros   +2 more
wiley   +1 more source

Soft Error-Tolerant and Highly Stable Low-Power SRAM for Satellite Applications

Applied Sciences
As CMOS technology has advanced, the transistor integration density of static random-access memory (SRAM) cells has increased. This has led to a reduction in the critical charge of sensitive nodes, making the SRAM cells more susceptible to soft errors ...
Jong-Yeob Oh, Sung-Hun Jo
doaj   +1 more source

Bit Upset of 25 nm NAND Flash Memory Induced by Heavy Ion Irradiation

Yuanzineng kexue jishu, 2023
In order to investigate the influence of heavy ion fluence on single event upsets (SEU) and the SEU cross-section in NAND Flash memory, as well as the multiple-cell upsets (MCU) due to heavy ion irradiation, experimental studies were performed on two ...
SHENG Jiangkun1,2;XU Peng1,*;QIU Mengtong2;DING Lili2;LUO Yinhong2;YAO Zhibin2;ZHANG Fengqi2;GOU Shilong2;WANG Zujun2
doaj   +1 more source

Effects of space radiation on electronic microcircuits [PDF]

The single event effects or phenomena (SEP), which so far have been observed as events falling on one or another of the SE classes: Single Event Upset (SEU), Single Event Latchup (SEL) and Single Event Burnout (SEB), are examined.
Kolasinski, W. A.
core   +1 more source

Method and apparatus for increasing resistance of bipolar buried layer integrated circuit devices to single-event upsets [PDF]

, 1991
Bipolar transistors fabricated in separate buried layers of an integrated circuit chip are electrically isolated with a built-in potential barrier established by doping the buried layer with a polarity opposite doping in the chip substrate.
Zoutendyk, John A.
core   +1 more source

Habitat Amount Shapes Ant Diversity in the Central Amazon

Biotropica, Volume 58, Issue 1, January 2026.
Ant diversity in fragmented Amazonian forest landscapes is primarily driven by landscape‐scale habitat amount rather than fragment size, supporting the Habitat Amount Hypothesis (HAH) over Island Biogeography Theory (IBT). Consequently, conservation strategies should prioritize maintaining and restoring forest cover across human‐modified landscapes ...
Ricardo A. S. Ruaro, Lucas F. Colares, Heraldo L. Vasconcelos, Fabricio B. Baccaro   +3 more
wiley   +1 more source

SEE Test and Data Analysis for Complex FPGA Systems [PDF]

Critical space applications require knowledge of single event upset (SEU) susceptibility (mission survivability). Generic SEU test and analysis techniques do not provide adequate data for survivability analysis.
Berg, Melanie, Campola, Michael
core   +1 more source

Mapping the density of giant trees in the Amazon

New Phytologist, Volume 249, Issue 1, Page 152-168, January 2026.
Summary Tall trees (height ≥ 60 m) are keystone elements of tropical forests, strongly influencing biodiversity, carbon storage, and ecosystem resilience. Yet, their density and spatial distribution remain poorly quantified, especially in remote Amazonian regions, limiting our understanding of their ecological roles and contribution to forest–climate ...
Robson Borges de Lima, Diego Armando Silva da Silva, Matheus Henrique Nunes, Paulo R. de Lima Bittencourt, Peter Groenendyk, Cinthia Pereira de Oliveira, Daniela Granato‐Souza, Rinaldo L. Caraciolo Ferreira, José A. Aleixo da Silva, Jesús Aguirre‐Gutiérrez, Toby Jackson, João R. de Matos Filho, Perseu da Silva Aparício, Joselane P. Gomes da Silva, José Julio de Toledo, Marcelino Carneiro Guedes, Danilo R. Alves de Almeida, Niro Higuchi, Fabien H. Wagner, Jean Pierre Ometto, Eric Bastos Görgens   +20 more
wiley   +1 more source

Heavy Ion Irradiation Fluence Dependence for Single-Event Upsets of NAND Flash Memory [PDF]

We investigated the single-event effect (SEE) susceptibility of the Micron 16 nm NAND flash, and found the single-event upset (SEU) cross section varied inversely with fluence. The SEU cross section decreased with increasing fluence.
Chen, Dakai, Kim, Hak, LaBel, Kenneth, Ladbury, Raymond, Phan, Anthony, Seidleck, Christina, Wilcox, Edward   +6 more
core   +1 more source