Results 81 to 90 of about 16,144 (237)

MPHLDAE‐1DCNN: A Novel Denoising Method for Improved Fault Diagnosis

International Journal of Rotating Machinery, Volume 2026, Issue 1, 2026.
Fault diagnosis of rotating machines has undergone significant advancements through the use of deep learning models. However, the effectiveness of these models is often compromised by noisy raw vibration data collected from industrial machines, which can negatively impact accuracy rates. To address this challenge, we present an improved fault diagnosis
Fasikaw Kibrete, Dereje Engida Woldemichael, Hailu Shimels Gebremedhen, Sohini Basu Roy   +3 more
wiley   +1 more source

Heavy Ion and Proton-Induced Single Event Upset Characteristics of a 3D NAND Flash Memory [PDF]

We evaluated the effects of heavy ion and proton irradiation for a 3D NAND flash. The 3D NAND showed similar single-event upset (SEU) sensitivity to a planar NAND of identical density in the multiple-cell level (MLC) storage mode.
Chen, Dakai, Kim, Hak, Label, Kenneth, Ladbury, Raymond, Phan, Anthony, Seidleck, Christina, Wilcox, Edward   +6 more
core   +1 more source

Progress in Research on Alleviating the Symptoms Associated With Advanced Cancer Using Traditional Chinese Medicine

Pain Research and Management, Volume 2026, Issue 1, 2026.
Advanced cancer continues to pose a substantial global challenge, with complex symptom burdens and limited therapeutic options. Traditional Chinese Medicine (TCM), grounded in holistic theory and the principles of syndrome differentiation, employs interventions such as herbal medicine, acupuncture, moxibustion, and acupoint‐based therapies to address ...
Chunmeng Jiao, Ting Zhang, Yachen Yang, Ruofan Zhang, Wenbo Liu, Yanqing Wang, Lei Huang   +6 more
wiley   +1 more source

Enhancing SEU tolerance efficacy in advanced FinFET FPGA devices using system-level fine-grained spatial redundancy techniques

Nuclear Engineering and Technology
This paper investigates the Single Event Upset (SEU) sensitivity, system-level hardening effectiveness, and potential applications of high-performance 16 nm Field Programmable Gate Arrays (FPGAs) in radiation environments.
Chang Cai, Hong-Jie Zeng, Ze-Qi Huang, Xue-Zhi Zheng, Yi Sun, Jing Zhang, Min-Chi Hu, Han-Tao Jing, Zhi-Xin Tan, Rui-Rui Fan, Jun Ge, Shu-Sheng Pan   +11 more
doaj   +1 more source

Design and qualification of the SEU/TD Radiation Monitor chip [PDF]

This report describes the design, fabrication, and testing of the Single-Event Upset/Total Dose (SEU/TD) Radiation Monitor chip. The Radiation Monitor is scheduled to fly on the Mid-Course Space Experiment Satellite (MSX).
Blaes, Brent R., Buehler, Martin G., Hicks, Kenneth A., Soli, George A., Zamani, Nasser   +4 more
core   +1 more source

A single event upset tolerant latch with parallel nodes

IEICE Electronics Express, 2019
A single event upset (SEU) tolerant latch has been put forward in the current paper. By means of the parallel nodes structure design together with the layout-level optimization design, the proposed design is capable of substantially improving the ...
Changyong Liu, Nianlong Liu, Zhiting Lin, Xiulong Wu, Chunyu Peng, Qiang Zhao, Xuan Li, Junning Chen, Xuan Zeng, Xiangdong Hu   +9 more
semanticscholar   +1 more source

Effects of cosmic rays on single event upsets [PDF]

Assistance was provided to the Brookhaven Single Event Upset (SEU) Test Facility. Computer codes were developed for fragmentation and secondary radiation affecting Very Large Scale Integration (VLSI) in space.
Fogarty, T. N., Lowe, C. W., Olidapupo, A., Venable, D. D., Zajic, V.   +4 more
core   +1 more source

Non Radiation Hardened Microprocessors in Spaced Based Remote Sensing Systems [PDF]

, 2006
The CALIPSO (Cloud-Aerosol Lidar and Infrared Pathfinder Satellite Observations) mission is a comprehensive suite of active and passive sensors including a 20Hz 230mj Nd:YAG lidar, a visible wavelength Earth-looking camera and an imaging infrared ...
Decoursey, Robert J., Estes, Robert F., Melton, Ryan   +2 more
core   +1 more source

USING THE SOCHI STAND TO CONFIRM THE IMMATIBILITY OF THE INTEGRATED CIRCUIT

Безопасность информационных технологий
The paper analyzes the possible to apply of the SOCHI stand for the purpose of controlling the immutability of the chip`s topology in order trust (in reliable and safe operation).
Dmitry V. Bobrovsky, Ivan I. Shvetsov-Shilovskiy, Alexander I. Chumakov, Sergey A. Soloviev, Evgeny M. Syresin, Alexei A. Slivin, Georgii A. Filatov   +6 more
doaj   +1 more source

Xilinx Kintex-UltraScale Field Programmable Gate Array Single Event Effects (SEE) Heavy-Ion Test Report [PDF]

This is an independent investigation that evaluates the single event destructive and transient susceptibility of the Xilinx Kintex-UltraScale device. Design/Device susceptibility is determined by monitoring the device under test (DUT) for Single Event ...
Berg, Melanie, Campola, Michael, Kim, Hak, Label, Ken, Phan, Anthony, Seidleck, Christina   +5 more
core   +1 more source