Results 161 to 170 of about 8,141,274 (193)
Some of the next articles are maybe not open access.
Extended Compendium of Total Ionizing Dose (TID) Test Results for the Europa Clipper Mission
2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC), 2022Wilson Parker, Bernie Rax
exaly +2 more sources
Total Ionizing Dose (TID) of Phase Change Random Access Memory
2021 4th International Conference on Radiation Effects of Electronic Devices (ICREED), 2021Phase Change Random Access Memory (PCRAM) were irradiated by 60Co γ-rays and electron beam, and used different temperature to anneal after irradiation. The DC parameters and function were tested by very large scale integrated (VLSI) circuit tester. The function of device was failure in radiation, and some DC parameters as radiation-sensitive parameters
Xingyao Zhang +3 more
openaire +1 more source
Total Ionization Dose (TID) Effects on 2D MOS Devices
Transactions on Electrical and Electronic Materials, 2020Electronics and Electricals devices are used in radiations environments for space applications. Radiation has immense potential to disturb the basic properties of electronics devices by interfere with the devices. Radiations affect most MOSFET among the various electronics devices, by creating radiation induced total ionizing dose (TID) effects, single
Shashi Bala, Raj Kumar, Arvind Kumar
openaire +1 more source
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC), 2020
This paper investigates flight circuit application bias and irradiation dose rate dependencies ("test as you fly" conditions) in the total ionizing dose (TID) response of various electronic components considered for use in a space radiation environment.
Amanda N Bozovich
exaly +2 more sources
This paper investigates flight circuit application bias and irradiation dose rate dependencies ("test as you fly" conditions) in the total ionizing dose (TID) response of various electronic components considered for use in a space radiation environment.
Amanda N Bozovich
exaly +2 more sources
Total Ionizing Dose (TID) Tests on Non-Volatile Memories: Flash and MRAM [PDF]
2007 IEEE Radiation Effects Data Workshop, 2007 We report on TID tests of magnetoresistive random access memory (MRAM), and advanced 4 Gbit flash memories from three manufacturers. Both in-situ and biased interval irradiations were used to characterize the response of the total accumulated dose failures.
F Irom, D N Nguyen
exaly +2 more sources
Compendium of Total Ionizing Dose (TID) Test Results for the Europa Clipper Mission
2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018), 2018Amanda N Bozovich
exaly +2 more sources
Updated Compendium of Total Ionizing Dose (TID) Test Results for the Europa Clipper Mission
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC), 2020We present the results of total ionizing dose testing and analysis on Electric, Electronic, and Electromechanical (EEE) parts, tested by the Jet Propulsion Laboratory in support of the Europa Clipper Mission.
Amanda N Bozovich, Wilson P Parker
exaly +2 more sources
Total ionizing dose (TID) evaluation results of low dose rate testing for NASA programs
1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference, 2002Low dose rate radiation testing in the range of 0.01-0.20 rads(Si)/s has been performed at Goddard Space Flight Center on a wide variety of non-RH (rad-hard) part types in the last few years. This paper reports on recent test results of EEPROMs, Operational Amplifiers, Analog-to-Digital Converters (ADCs) and Digital-to-Analog Converters (DACs), and DC ...
A.K. Sharma, K. Sahu, S. Brashears
openaire +1 more source
Research on Combinatorial Feature of Total Ionizing Dose (TID) Effect on Interconnect
2019In mixed-mode simulation of this paper, the copper interconnect line structure in VDSM (very deep submicron) was connected to a circuit with the silica-based device (on-chip or inter-chip). A physical model of the mass transport of Cu interconnect is found based on the vacancy exchange mechanism based on a continuity equation on Cu diffusion including ...
Xiaofei Xu, Denghua Li, Shuhui Yang
openaire +1 more source
Total ionizing dose (TID) evaluation of magnetic tunnel junction (MTJ) current sensors
Sensors and Actuators A: Physical, 2015Abstract The paper shows an experimental study to know the behaviour of tunnel magnetoresistive effect-based current sensors configured in a Wheatstone bridge in response to irradiation. In particular the sensitivity, hysteresis, output offset voltage and input resistance are discussed when the sensors are submitted to a total irradiation dose of 43 ...
Sergio Iván Ravelo Arias +4 more
openaire +1 more source