Results 11 to 20 of about 337 (171)

Demonstration of hetero-gate-dielectric tunneling field-effect transistors (HG TFETs) [PDF]

open access: yesNano Convergence, 2016
The steady scaling-down of semiconductor device for improving performance has been the most important issue among researchers. Recently, as low-power consumption becomes one of the most important requirements, there have been many researches about novel devices for low-power consumption.
Choi, Woo Young, Lee, Hyun Kook
openaire   +3 more sources

Graphene antidot nanoribbon tunnel field‐effect transistor

open access: yesMicro & Nano Letters, 2022
A graphene nanoribbon tunnel field‐effect transistor (TFET) model is proposed, in which the antidot pattern is used to generate the heterojunction (HJ) band structure.
Zhixing Xiao
doaj   +1 more source

Switching performance assessment of gate-all-around InAs–Si vertical TFET with triple metal gate, a simulation study

open access: yesDiscover Nano, 2023
This study presents a gate-all-around InAs–Si vertical tunnel field-effect transistor with a triple metal gate (VTG-TFET). We obtained improved switching characteristics for the proposed design because of the improved electrostatic control on the channel
Dariush Madadi, Saeed Mohammadi
doaj   +1 more source

Optimization of Tunnel Field-Effect Transistor-Based ESD Protection Network

open access: yesCrystals, 2021
The tunnel field-effect transistor (TFET) is a potential candidate for replacing the reverse diode and providing a secondary path in a whole-chip electrostatic discharge (ESD) protection network.
Zhihua Zhu   +5 more
doaj   +1 more source

Advancing the Frontiers of HfO<sub>2</sub>-Based Ferroelectric Memories: Innovative Concepts from Materials to Applications. [PDF]

open access: yesAdv Mater
HfO2‐based ferroelectric materials are promising for next‐generation memory technologies by providing outstanding performance aligning with data‐centric computing needs. This review details recent advancements in materials, devices, and integration for HfO2‐based memories, with the goal of identifying both the technological opportunities and remaining ...
Zhou Z   +9 more
europepmc   +2 more sources

Dependency of Tunneling Field-Effect Transistor(TFET) Characteristics on Operation Regions [PDF]

open access: yesJSTS:Journal of Semiconductor Technology and Science, 2011
In this paper, two competing mechanisms determining drain current of tunneling field-effect transistors (TFETs) have been investigated such as band-to-band tunneling and drift. Based on the results, the characteristics of TFETs have been discussed in the tunneling-dominant and drift- dominant region.
Min-Jin Lee, Woo-Young Choi
openaire   +1 more source

Effect of band to band tunnelling (BTBT) on multi-gate Tunnel field effect transistors (TFETs)-A Review

open access: yesIOP Conference Series: Materials Science and Engineering, 2021
Abstract TFETs (tunnel field effect transistor) are providing solution to affairs associated with conventional MOSFET devices such as short-channel effects (SCEs) and limitation of minimum (60 mV/decade) subthreshold slope (SS). TFET is a p-i-n diode which conducts in reverse bias and behaves like a transistor due to tunnelling mechanism
P Shilla, V Verma, R Kumar, A Kumar
openaire   +1 more source

In-Line Tunnel Field Effect Transistor: Drive Current Improvement

open access: yesIEEE Journal of the Electron Devices Society, 2018
A new architecture of tunnel field effect transistor (TFET) with in-line (vertical) tunneling area is introduced. By adding the vertical tunneling area, the in-line TFET architecture outperformed the normal TFET in terms of the drive current, the ...
Woojin Park   +3 more
doaj   +1 more source

Study of Electrical Performance of Hetero-Dielectric Gate Tunnel Field Effect Transistor (HDG TFET): A Novel Structure for Future Nanotechnology

open access: yesJournal of Engineering Technology and Applied Physics, 2022
Although, dynamic power in portable mobile devices can be reduced by reducing power supply VDDon the cost of increased leakage current. Therefore, maintaining low leakage current in the device is serious issue for minimizing overall ...
Tan Chun Fui   +2 more
doaj   +1 more source

Investigation of Radiation Hardened TFET SRAM Cell for Mitigation of Single Event Upset

open access: yesIEEE Journal of the Electron Devices Society, 2020
This study analyzes the soft error sensitivity of SRAM cell which employs double-gate tunnel field effect transistor (DG TFET). The mitigation technique for the data recovery after the heavy ion strike is discussed.
M. Pown, B. Lakshmi
doaj   +1 more source

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