Results 151 to 160 of about 10,230,919 (179)

QLC Programmable 3D Ferroelectric NAND Flash Memory by Memory Window Expansion Using Cell Stack Engineering

2023
Seiyon Kim, Young Mo Kim, Myung-Hee Na
exaly  

Threshold Voltage Variations of 3D V-NAND Flash Memory Devices Due to Different Positions and Angles of the Single Grain Boundary

Journal of Nanoscience and Nanotechnology, 2017
Jun Gyu Lee, Keon-Ho Yoo, Tae Whan Kim
openaire   +1 more source

Reliability of NAND Flash Memories: Planar Cells and Emerging Issues in 3D Devices

Computers, 2017
Christian Monzio Compagnoni, Alessandro Sottocornola Spinelli, Andrea L. Lacaita   +2 more
exaly  

Innovative V-NAND Flash Structure with Dual Trap Layer for Future Generations of Multi-Bit Device

2025 IEEE International Memory Workshop (IMW)
Jeongyoon Yeo, Joonsung Kim, Younghwan Son, Taein Lee, Sejun Park, Min-Kyu Jeong, Jung Hoon Lee, Suk-Kang Sung, Dongku Kang, Seungwan Hong, Sunghoi Hur   +10 more
openaire   +1 more source

Overcoming conventional limit of process variation by using virtual metrology with mass-based monitoring in V-NAND

Metrology, Inspection, and Process Control XL
Ju-Young Cho, Joonsung Lim, Dong-Hyeon Ko, Ikjun Choi, Sungyoon Ryu, Woongseop Lee, Younghoon Sohn, Byoungil Lee, Kyungyoon Noh, Seungwan Hong, Sung-Hoi Hur, Jin-Yub Lee   +11 more
openaire   +1 more source

Improving 3D NAND Flash Memory Lifetime by Tolerating Early Retention Loss and Process Variation

Proceedings of the ACM on Measurement and Analysis of Computing Systems, 2018
Onur Mutlu, Yixin Luo, Saugata Ghose
exaly  

A method for the periodic boundary condition for thermo-elastic analysis of V-NAND flash memory structure

Mechanics of Advanced Materials and Structures
Yongha Kim, Seungjun Ryu, Sungryung Lee
openaire   +1 more source

First Demonstration of Threshold Voltage Modeling in Multi-Hole V-NAND Flash Architecture with Noncircular Channel Hole Profiles

2025 IEEE International Memory Workshop (IMW)
Chanyang Park, Min-Kyu Jeong, Taein Lee, Sejun Park, Jung Hoon Lee, Yujin Lee, Seungwan Hong, Sunghoi Hur   +7 more
openaire   +1 more source

Effective defect detection in 3D V-NAND flash memory using color-based image processing

Metrology, Inspection, and Process Control XL
Jiwon Shin, Byung Yong Choi, Hoyun Jung, Kyungyoon Noh, Bong-Tae Park, Seungwan Hong, Sung Hoi Hur   +6 more
openaire   +1 more source

A 70 nm 16 Gb 16-Level-Cell NAND Flash Memory

IEEE Journal of Solid-State Circuits, 2008
Noboru Shibata, K Imamiya, Kiyoaki Iwasa
exaly