Results 141 to 150 of about 2,676 (201)
Flexible monolithic 3D complementary circuits based on 2D semiconductor inks. [PDF]
Zou T +10 more
europepmc +1 more source
Quantitative analysis of lung microwave ablation zone volume and shape. [PDF]
Salkin RS +12 more
europepmc +1 more source
Flash Memory for Synaptic Plasticity in Neuromorphic Computing: A Review. [PDF]
Im J, Pak S, Woo SY, Shin W, Lee ST.
europepmc +1 more source
High-κ Perovskite-Like Ternary Niobium Oxide Dielectrics for 2D Electronics. [PDF]
Zhang B +10 more
europepmc +1 more source
Characterizing 3D Floating Gate NAND Flash
As both NAND flash memory manufacturers and users are turning their attentions from planar architecture towards three-dimensional (3D) architecture, it becomes critical and urgent to understand the characteristics of 3D NAND flash memory. These characteristics, especially those different from planar NAND flash, can significantly affect design choices ...
Qin Xiong, Fei Wu, Zhonghai Lu
exaly +3 more sources
3D RRAM design and benchmark with 3d NAND FLASH
The monolithic 3D integration of resistive switching random access memory (RRAM) is one attractive approach to build high-density non-volatile memory. In this paper, the design considerations of 3D vertical RRAM architecture are presented from the device, circuit to system level. Due to the voltage drop and sneak path problem, the sub-array size of the
Pai-Yu Chen +3 more
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Reliability of 3D NAND Flash Memories
In this chapter the main reliability mechanisms affecting 3D NAND memories will be addressed, providing a comparison between 3D FG and 3D CT devices in terms of reliability and expected performances. Starting from an analysis of basic reliability issues related to both physical and architectural aspects affecting NAND memories, the specific physical ...
GROSSI, Alessandro +2 more
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Characterizing 3D Floating Gate NAND Flash
In this paper, we characterize a state-of-the-art 3D floating gate NAND flash memory through comprehensive experiments on an FPGA platform. Then, we present distinct observations on performance and reliability, such as operation latencies and various error patterns. We believe that through our work, novel 3D NAND flash-oriented designs can be developed
Qin Xiong +7 more
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Reliability challenges in 3D NAND Flash memories
The reliability of 3D NAND Flash memory technology is depending on many factors. Most of them are related to the process-induced variability of the layers. Endurance, data retention capabilities, and cross-temperature immunity are the metrics that become affected by this, turning in peculiar reliability challenges that are difficult to be tackled ...
Zambelli C., Micheloni R., Olivo P.
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Modeling and Optimization of Advanced 3D NAND Memory
2020 Device Research Conference (DRC), 2020Development of a new complex technology such as 3D NAND requires significant efforts in terms of materials screening, process tuning, and device design leading to fabrication and characterization of many test wafers with significant time-to-market cost. In this context, modeling can help accelerate 3D NAND technology development.
Mehdi Saremi +7 more
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