Results 51 to 60 of about 1,500,059 (236)
Framework to Enhance Teaching and Learning in System Analysis and Unified Modelling Language [PDF]
Cowling, MA ORCiD: 0000-0003-1444-1563; Munoz Carpio, JC ORCiD: 0000-0003-0251-5510Systems Analysis modelling is considered foundational for Information and Communication Technology (ICT) students, with introductory and advanced units included in nearly ...
Birt, James R. +2 more
core +2 more sources
Self-organizing Map (SOM) neural network is a prominent algorithm in unsupervised machine learning, which is widely used for data clustering, high-dimensional visualization, and feature extraction.
Anyi Zhu +4 more
doaj +1 more source
Universal Three Dimensional Optical Logic
Modern integrated circuits are essentially two-dimensional (2D). Partial three-dimensional (3D) integration and 3D-transistor-level integrated circuits have long been anticipated as routes to improve the performance, cost and size of electronic computing
Ensley, Mcleod, Miller, Minardi, Solli
core +1 more source
Spectrally Tunable 2D Material‐Based Infrared Photodetectors for Intelligent Optoelectronics
Intelligent optoelectronics through spectral engineering of 2D material‐based infrared photodetectors. Abstract The evolution of intelligent optoelectronic systems is driven by artificial intelligence (AI). However, their practical realization hinges on the ability to dynamically capture and process optical signals across a broad infrared (IR) spectrum.
Junheon Ha +18 more
wiley +1 more source
Total Ionizing Dose Effects in Advanced 28 nm Charge Trapping 3D NAND Flash Memory
The impacts of total ionizing dose (TID) were investigated in 28 nm 3D charge trapping (CT) NAND Flash memories. This study focused on the variations in the raw bit error rate (RBER) of irradiated flash across different operational modes and bias states.
Xuesong Zheng +6 more
semanticscholar +1 more source
An Improved Dimensional Measurement Method of Staircase Patterns With Higher Precision in 3D NAND
3D NAND is a great architectural innovation in the field of flash memory. The staircase for control gate is a unique and important process in the manufacturing of 3D NAND.
Peizhen Hong +7 more
doaj +1 more source
Charge Loss Induced by Defects of Transition Layer in Charge-Trap 3D NAND Flash Memory
In charge-trap (CT) three-dimensional (3D) NAND flash memory, the transition layer between Si3N4 CT layer and SiO2 tunneling layer is inevitable, and the defects in the transition layer are expected to cause both lateral and vertical charge loss.
Fei Wang +3 more
doaj +1 more source
Coding scheme for 3D vertical flash memory
Recently introduced 3D vertical flash memory is expected to be a disruptive technology since it overcomes scaling challenges of conventional 2D planar flash memory by stacking up cells in the vertical direction.
Bandic, Zvonimir +4 more
core +1 more source
Tin hexathiophosphate memristors leverage intrinsic nanopores together with a guided filament formation strategy to regulate titanium ion motion and switching behavior. The devices support reliable nonvolatile memory and reconfigurable logic‐in‐memory, demonstrating 14 Boolean logic functions in a single cell.
Thaw Tint Te Tun +7 more
wiley +1 more source
This study demonstrates a monolithic perovskite OELG device that performs all eight logic operations, including XOR and XNOR, without external bias. Enabled by trap‐engineered MAPbI3:PLL and dual photogates, it achieves reconfigurable logic and parallel decoding of amplitude–frequency signals, supporting scenario‐configured logic‐level separation for ...
Dante Ahn +13 more
wiley +1 more source

