Results 101 to 110 of about 4,160 (185)

Investigation of Program Efficiency Overshoot in 3D Vertical Channel NAND Flash with Randomly Distributed Traps. [PDF]

Nanomaterials (Basel), 2023
Park C, Yoon JS, Nam K, Jang H, Park M, Baek RH.   +5 more
europepmc   +1 more source

Activation Enhancement and Grain Size Improvement for Poly-Si Channel Vertical Transistor by Laser Thermal Annealing in 3D NAND Flash. [PDF]

Micromachines (Basel), 2023
Yang T, Xia Z, Fan D, Zhao D, Xie W, Yang Y, Liu L, Zhou W, Huo Z.   +8 more
europepmc   +1 more source

Concealable physical unclonable functions using vertical NAND flash memory. [PDF]

Nat Commun
Park SH, Koo RH, Yang Y, Im J, Ko J, Lee JH.   +5 more
europepmc   +1 more source

Flash Memory for Synaptic Plasticity in Neuromorphic Computing: A Review. [PDF]

Biomimetics (Basel)
Im J, Pak S, Woo SY, Shin W, Lee ST.
europepmc   +1 more source

Ferroelectric NAND for efficient hardware bayesian neural networks. [PDF]

Nat Commun
Song M, Koo RH, Kim J, Han CH, Yim J, Ko J, Yoo S, Choe DH, Kim S, Shin W, Kwon D.   +10 more
europepmc   +1 more source

A full-featured 2D flash chip enabled by system integration. [PDF]

Nature
Liu C, Jiang Y, Shen B, Yuan S, Cao Z, Bi Z, Wang C, Xiang Y, Wang T, Wu H, Liu Z, Wang Y, Wang S, Zhou P.   +13 more
europepmc   +1 more source

Origin of the Temperature Dependence of Gate-Induced Drain Leakage-Assisted Erase in Three-Dimensional nand Flash Memories. [PDF]

Micromachines (Basel)
Refaldi DG, Malavena G, Chiavarone L, Spinelli AS, Monzio Compagnoni C.   +4 more
europepmc   +1 more source

Recent advances in ferroelectric materials, devices, and in-memory computing applications. [PDF]

Nano Converg
Hwang H, Youn S, Kim H.
europepmc   +1 more source

Analysis of the Ambipolar Conduction of Tin Monoxide Thin-Film Transistors with Indium Tin Oxide Electrodes. [PDF]

ACS Appl Mater Interfaces
Mun SA, Park S, Lee MH, Lee Y, Kang S, Choi J, Ham J, Choi J, Hwang CS.   +8 more
europepmc   +1 more source

Two-Dimensional Materials, the Ultimate Solution for Future Electronics and Very-Large-Scale Integrated Circuits. [PDF]

Nanomicro Lett
Qin L, Wang L.
europepmc   +1 more source