Results 101 to 110 of about 261,592 (260)

Auger recombination coefficient in heavily nitrogen-doped 4H-SiC under high-level injection conditions

open access: yesApplied Physics Express
4H-SiC is a pivotal semiconductor for high-power, high-temperature devices, where Auger recombination significantly affects performance under high carrier injection. While previously studied in lightly doped material, data for heavily doped n-type 4H-SiC
Endong Zhang   +2 more
doaj   +1 more source

Novel Power Si/4H-SiC Heterojunction Tunneling Transistor (HETT)

open access: hybrid, 2006
Tetsuya Hayashi   +5 more
openalex   +1 more source

Influence Of Growth Conditions on Irradiation Induced Defects in 4H-SiC

open access: hybrid, 2007
Ioana Pintilie   +4 more
openalex   +1 more source

Confocal photoluminescence characterization of silicon-vacancy color centers in 4H-SiC fabricated by a femtosecond laser [PDF]

open access: diamond, 2020
Jiayu Liu   +12 more
openalex   +1 more source

Simulation and Analysis of Static Temperature Characteristics of 4H-SiC MOSFET

open access: yes机车电传动, 2020
SiC materials have excellent properties such as large forbidden band width, high critical electric field, high carrier saturation drift speed and high thermal conductivity, making them widely used in high temperature, high voltage, high power and other ...
Liang ZENG   +5 more
doaj  

DFT modelling of the edge dislocation in 4H-SiC [PDF]

open access: hybrid, 2019
Jan Łażewski   +7 more
openalex   +1 more source

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