Results 11 to 20 of about 42,361 (184)
SiC MOSFETs display reliability issues related to the quality of SiO2/SiC interface and bulk material due to the presence of near interface traps and point and extended material defects [1]. These material related issues give rise to a degradation of device reliability and ruggedness.
Lee, Geon Hee +3 more
openaire +2 more sources
An Experimental Investigation of MOSFET Intrisic Body Diode Performance [PDF]
In order to enable evaluation of power loss during both forward and reverse conduction of intrinsic body diodes in power MOSFETs, an experimental series is performed to derive a set of expressions to approximate performance. A set of relevant performance metrics are selected, and then tested over a range of devices.
Petersen, A., Stone, D.A., Foster, M.P.
openaire +4 more sources
In this study, a novel 4H-SiC double-trench metal-oxide semiconductor field-effect transistor (MOSFET) with a side wall heterojunction diode is proposed and investigated by conducting numerical technology computer-aided design simulations.
Junghun Kim, Kwangsoo Kim
doaj +2 more sources
Power metal-oxide-semiconductor field-effect transistors (MOSFETs) provide numerous advantages and are widely utilized in various power circuits. The junction temperature plays a critical role in determining the reliability, performance, and operational ...
Xueli Zhu +8 more
doaj +2 more sources
The Road to a Robust and Affordable SiC Power MOSFET Technology
This article provides a detailed study of performance and reliability issues and trade-offs in silicon carbide (SiC) power MOSFETs. The reliability issues such as threshold voltage variation across devices from the same vendor, instability of threshold ...
Hema Lata Rao Maddi +9 more
doaj +1 more source
4H-SiC Metal-Oxide-Semiconductor Field Effect Transistors (MOSFETs) with embedded Schottky barrier diodes are widely known to improve switching energy loss by reducing reverse recovery characteristics.
Kyuhyun Cha, Kwangsoo Kim
doaj +1 more source
The value of a semiconductor’s diode temperature determines the correct operation of this element and its useful lifetime. One of the methods for determining the die temperature of a semiconductor diode is through the use of indirect thermographic ...
Arkadiusz Hulewicz +2 more
doaj +1 more source
Performance improvement of three-body radiative diode driven by graphene surface plasmon polaritons
As an analogue to electrical diode, a radiative thermal diode allows radiation to transfer more efficiently in one direction than in the opposite direction by operating in a contactless mode.
He-Ping Tan (3959759) +5 more
core +2 more sources
Junction temperature monitoring for cascode GaN devices using the Si MOSFET's body diode voltage drop [PDF]
In this paper, a new online junction temperature monitoring method is proposed for cascode GaN devices using the body diode of Si MOSFET. The reverse current during soft-switching mode is utilized to extract the voltage drop of the Si MOSFET's body diode.
Francesco Iannuzzo +3 more
core +1 more source
Laser microdissection as a new approach to prefertilization genetic diagnosis [PDF]
The genetic status of oocytes can be determined by polar body (PB) analysis. Following PB extraction, a genetic evaluation is performed. As each PB contains the complementary genetic material of the oocyte, PB analysis reveals information about its ...
Schütze, Karin +2 more
core +1 more source

