Results 11 to 20 of about 42,361 (184)

Measurement and Analysis of Body Diode Stress of 3.3 kV Sic-Mosfets with Intrinsic Body Diode and Embedded SBD

open access: yesMaterials Science Forum, 2023
SiC MOSFETs display reliability issues related to the quality of SiO2/SiC interface and bulk material due to the presence of near interface traps and point and extended material defects [1]. These material related issues give rise to a degradation of device reliability and ruggedness.
Lee, Geon Hee   +3 more
openaire   +2 more sources

An Experimental Investigation of MOSFET Intrisic Body Diode Performance [PDF]

open access: yes2018 IEEE 27th International Symposium on Industrial Electronics (ISIE), 2018
In order to enable evaluation of power loss during both forward and reverse conduction of intrinsic body diodes in power MOSFETs, an experimental series is performed to derive a set of expressions to approximate performance. A set of relevant performance metrics are selected, and then tested over a range of devices.
Petersen, A., Stone, D.A., Foster, M.P.
openaire   +4 more sources

4H-SiC Double-Trench MOSFET with Side Wall Heterojunction Diode for Enhanced Reverse Recovery Performance

open access: yesEnergies, 2020
In this study, a novel 4H-SiC double-trench metal-oxide semiconductor field-effect transistor (MOSFET) with a side wall heterojunction diode is proposed and investigated by conducting numerical technology computer-aided design simulations.
Junghun Kim, Kwangsoo Kim
doaj   +2 more sources

Online Junction Temperature Measurement for Power MOSFETs Using the Body Diode Under Varying Forward Currents

open access: yesEnergies
Power metal-oxide-semiconductor field-effect transistors (MOSFETs) provide numerous advantages and are widely utilized in various power circuits. The junction temperature plays a critical role in determining the reliability, performance, and operational ...
Xueli Zhu   +8 more
doaj   +2 more sources

The Road to a Robust and Affordable SiC Power MOSFET Technology

open access: yesEnergies, 2021
This article provides a detailed study of performance and reliability issues and trade-offs in silicon carbide (SiC) power MOSFETs. The reliability issues such as threshold voltage variation across devices from the same vendor, instability of threshold ...
Hema Lata Rao Maddi   +9 more
doaj   +1 more source

Asymmetric Split-Gate 4H-SiC MOSFET with Embedded Schottky Barrier Diode for High-Frequency Applications

open access: yesEnergies, 2021
4H-SiC Metal-Oxide-Semiconductor Field Effect Transistors (MOSFETs) with embedded Schottky barrier diodes are widely known to improve switching energy loss by reducing reverse recovery characteristics.
Kyuhyun Cha, Kwangsoo Kim
doaj   +1 more source

The Estimated Temperature of the Semiconductor Diode Junction on the Basis of the Remote Thermographic Measurement

open access: yesSensors, 2023
The value of a semiconductor’s diode temperature determines the correct operation of this element and its useful lifetime. One of the methods for determining the die temperature of a semiconductor diode is through the use of indirect thermographic ...
Arkadiusz Hulewicz   +2 more
doaj   +1 more source

Performance improvement of three-body radiative diode driven by graphene surface plasmon polaritons

open access: yes, 2023
As an analogue to electrical diode, a radiative thermal diode allows radiation to transfer more efficiently in one direction than in the opposite direction by operating in a contactless mode.
He-Ping Tan (3959759)   +5 more
core   +2 more sources

Junction temperature monitoring for cascode GaN devices using the Si MOSFET's body diode voltage drop [PDF]

open access: yes, 2023
In this paper, a new online junction temperature monitoring method is proposed for cascode GaN devices using the body diode of Si MOSFET. The reverse current during soft-switching mode is utilized to extract the voltage drop of the Si MOSFET's body diode.
Francesco Iannuzzo   +3 more
core   +1 more source

Laser microdissection as a new approach to prefertilization genetic diagnosis [PDF]

open access: yes, 2000
The genetic status of oocytes can be determined by polar body (PB) analysis. Following PB extraction, a genetic evaluation is performed. As each PB contains the complementary genetic material of the oocyte, PB analysis reveals information about its ...
Schütze, Karin   +2 more
core   +1 more source

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