Results 1 to 10 of about 14,758 (228)

Experiment and Analysis of Termination Robustness Design for 1200 V 4H-SiC MOSFET [PDF]

open access: yesNanomaterials
This study investigates the degradation mechanisms of 1200 V SiC MOSFETs during High-temperature Reverse Bias (HTRB) reliability testing, focusing on breakdown voltage (BV) reduction.
Mengyuan Yu   +3 more
doaj   +2 more sources

I–V Characteristics and Electrical Reliability of Metal–SixNy–Metal Capacitors as a Function of Nitrogen Bonding Composition [PDF]

open access: yesMicromachines
In this study, we analyzed the electrical characteristics of metal–insulator–metal (MIM) capacitors fabricated with reference to insulator (SixNy) thickness and deposition condition.
Tae-Min Choi   +5 more
doaj   +2 more sources

A 3.3 kV SiC Semi-Superjunction MOSFET with Trench Sidewall Implantations [PDF]

open access: yesMicromachines
Superjunction (SJ) technology offers a promising solution to the challenges faced by silicon carbide (SiC) Metal Oxide Semiconductor Field-Effect Transistors (MOSFETs) operating at high voltages (>3 kV).
Marco Boccarossa   +8 more
doaj   +2 more sources

Optimisation of Negative Fixed Charge Based Edge Termination for Vertical GaN Schottky Devices [PDF]

open access: yesMicromachines
This study focuses on the impact of negative fixed charge, achieved through fluorine (F) implantation, on breakdown voltage (BV) enhancement in vertical GaN Schottky diodes.
Vishwajeet Maurya   +4 more
doaj   +2 more sources

Improving Breakdown Voltage and Threshold Voltage Stability by Clamping Channel Potential for Short-Channel Power p-GaN HEMTs

open access: yesMicromachines, 2022
This paper proposes a novel p-GaN HEMT (P-HEMT) by clamping channel potential to improve breakdown voltage (BV) and threshold voltage (VTH) stability.
Hongyue Wang   +5 more
doaj   +1 more source

Improvement in Turn-Off Loss of the Super Junction IGBT with Separated n-Buffer Layers

open access: yesMicromachines, 2021
In this study, we propose a super junction insulated-gate bipolar transistor (SJBT) with separated n-buffer layers to solve a relatively long time for carrier annihilation during turn-off.
Ki Yeong Kim   +3 more
doaj   +1 more source

Erratum to: Modeling and experimental study on breakdown voltage (BV) in low speed wire electrical discharge machining (LS-WEDM) of Ti-6Al-4V [PDF]

open access: yesThe International Journal of Advanced Manufacturing Technology, 2017
In this study, the breakdown voltage behavior in low speed wire electrical discharge machining (LS-WEDM) of Ti-6Al-4V (TC4) in the deionized water is investigated. Firstly, the electric field distortion caused by impurity particles including TC4 or brass metal and bubbles is investigated.
Yadong Gong   +5 more
openaire   +1 more source

GaN/Si Heterojunction VDMOS with High Breakdown Voltage and Low Specific On-Resistance

open access: yesMicromachines, 2023
A novel VDMOS with the GaN/Si heterojunction (GaN/Si VDMOS) is proposed in this letter to optimize the breakdown voltage (BV) and the specific on-resistance (Ron,sp) by Breakdown Point Transfer (BPT), which transfers the breakdown point from the high ...
Xin Yang, Baoxing Duan, Yintang Yang
doaj   +1 more source

Breakdown voltage characteristics of combined air gaps under negative lightning impulse

open access: yesEnergy Reports, 2022
Long air gaps are the main external insulation medium of overhead transmission lines. When there are floating conductors in the air gap, the gap’s configuration changes, and the combined air gaps is formed. We built an experimental platform to obtain the
Shaocheng Wu   +7 more
doaj   +1 more source

Novel SiC/Si heterojunction LDMOS with electric field modulation effect by reversed L-shaped field plate

open access: yesResults in Physics, 2020
A novel SiC/Si heterojunction lateral double-diffused metal-oxidesemiconductor (LDMOS) with a reversed L-shaped field plate and a stepped oxide layer has been proposed to improve the tradeoff between the breakdown voltage (BV) and specific on-resistance (
Qi Li   +8 more
doaj   +1 more source

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