Results 21 to 30 of about 19,099,873 (241)
Time dependent dielectric breakdown and stress induced leakage current characteristics of 8Å EOT HfO2 N-MOSFETS [PDF]
In this work we present the time dependent dielectric breakdown (TDDB) characteristics of LaO capped HfO2 layers with an equivalent oxide thickness of 8Å. The layers show maximum operating voltages in excess of 1V. Such high reliability can be attributed
Ragnarsson, Lars-Ake +8 more
core +2 more sources
The Study of High Breakdown Voltage Vertical GaN-on-GaN p-i-n Diode with Modified Mesa Structure
In this paper, we fabricated Gallium Nitride (GaN) vertical p-i-n diodes grown on free-standing GaN (FS-GaN) substrates. This homogeneous epitaxy led to thicker GaN epi-layers grown on the FS-GaN substrate, but a high crystalline quality was maintained ...
Wen-Chieh Ho +6 more
doaj +1 more source
Influence of Terminal Field Plate on Breakdown Voltage in GaN-Based Schottky Barrier Diode
In order to improve the breakdown voltage of the Schottky barrier diode(SBD), a GaN-based SBD with a field plate(FP) structure has been systematically studied.
ZHU Youhua +3 more
doaj +1 more source
Breakdown voltage (BV), on-state voltage (Von), static latch-up voltage (Vlu), static latch-up current density (Jlu), and threshold voltage (Vth), etc., are critical static characteristic parameters of an IGBT for researchers.
Qing Yao +9 more
doaj +1 more source
A Novel Shielded IGBT (SIGBT) With Integrated Diodes
A novel 3.3 kV Shielded Insulated Gate Bipolar Transistor (SIGBT) is proposed in this paper. Unlike the partly shielded N-injector of the diode-clamped TIGBT, which is the carrier store layer, the SIGBT features a diode-clamped P-layer to completely ...
Rongxin Chen +3 more
doaj +1 more source
A Novel AlGaN/Si3N4 Compound Buffer Layer HEMT with Improved Breakdown Performances
In this article, an AlGaN and Si3N4 compound buffer layer high electron mobility transistor (HEMT) is proposed and analyzed through TCAD simulations. In the proposed HEMT, the Si3N4 insulating layer is partially buried between the AlGaN buffer layer and ...
Jingwei Guo +6 more
doaj +1 more source
Experimental Study of High Performance 4H-SiC Floating Junction JBS Diodes
This paper reports the demonstration of a high performance 4H-SiC floating junction junction barrier Schottky (FJ_JBS) rectifier with a 30μm, 6×1015 cm-3-doped epitaxial layer.
Hao Yuan +9 more
doaj +1 more source
Performance analysis of a novel trench SOI LDMOS with centrosymmetric double vertical field plates
A novel trench SOI LDMOS with centrosymmetric double vertical field plates structure (CDVFPT SOI LDMOS) is proposed in this paper. The 2-D device simulator MEDICI is used to investigate the characteristics of the proposed structure.
Jianmei Lei +8 more
doaj +1 more source
The valve side of the converter in the high-voltage direct current is subjected to mixed voltages such as composite AC & DC voltage. In this study, the effects of the homogeneity of electric field on breakdown voltage were investigated for different +
İSPİRLİ, MEHMET MURAT, ORAL, BÜLENT
core +1 more source
Realization of High Current Gain for Van der Waals MoS2/WSe2/MoS2 Bipolar Junction Transistor
Two-dimensional (2D) materials have attracted great attention in the past few years and offer new opportunities for the development of high-performance and multifunctional bipolar junction transistors (BJTs). Here, a van der Waals BJT based on vertically
Zezhang Yan, Ningsheng Xu, Shaozhi Deng
doaj +1 more source

