Results 31 to 40 of about 6,733 (201)

Electrostatic discharge protection of MiniLED backlight units on glass

open access: yesEnergy Reports, 2021
Active matrix (AM) MiniLED backlight units (BLU) on glass substrate is developed to solve severe problems of MiniLED on PCB including insufficient heat dissipation and worse swelling and shrinking performance, as well as limited zone number. However, the
Juncheng Xiao   +8 more
doaj   +1 more source

Study on CDM ESD Robustness Among On-Chip Decoupling Capacitors in CMOS Integrated Circuits

open access: yesIEEE Journal of the Electron Devices Society, 2021
The integrated circuit (IC) products fabricated in the scaled-down CMOS processes with higher clock rate and lower power supply voltage (VDD) are more sensitive to the transient/switching noises on the power lines with the parasitic inductance induced by
Yi-Chun Huang, Ming-Dou Ker
doaj   +1 more source

Component lifetime modelling [PDF]

open access: yes, 1994
There are two approaches to component lifetime modelling. The first one uses a reliability prediction method as described in the (military) handbooks with the appropriate models and parameters.
Hu   +13 more
core   +2 more sources

Nonlinear conductive behavior of MoS2/PDMS composites for self-adaptive electrostatic protection

open access: yesPolymer Testing
Electrostatic discharge (ESD) poses a significant threat to electronic components and systems. Self-adaptive electrostatic protection materials (SAEs) are in urgent demand yet still remain a great challenge.
Hongfei Li   +4 more
doaj   +1 more source

Entropy‐Driven Design of Stable High‐Performance Sodium‐Ion Battery Cathodes

open access: yesEcoEnergy, EarlyView.
This review explores high‐entropy strategies for advanced sodium‐ion battery cathodes, focusing on LTMOs and PBAs. It details how entropy engineering mitigates challenges: phase transitions, interface degradation, and air instability in LTMOs; vacancy defects and crystalline water in PBAs.
Feng Zhan   +8 more
wiley   +1 more source

Improving ESD Protection Robustness Using SiGe Source/Drain Regions in Tunnel FET

open access: yesMicromachines, 2018
Currently, a tunnel field-effect transistor (TFET) is being considered as a suitable electrostatic discharge (ESD) protection device in advanced technology.
Zhaonian Yang   +3 more
doaj   +1 more source

Recent Advances in Conductive Rubber Composites: Progress, Challenges, and Emerging Opportunities

open access: yesMacromolecular Rapid Communications, EarlyView.
This study reviews the recent advances in conductive rubber composites, focusing on key aspects such as material selection, conductive mechanisms, interfacial engineering, processing methods, vulcanization strategies, and practical applications. It also discusses current challenges and highlights emerging directions that are shaping the development of ...
Lu Yin   +3 more
wiley   +1 more source

Deep sub-micron ESD GGNMOS layout design and optimization

open access: yesMATEC Web of Conferences, 2018
In the field of integrated circuits, ESD (Electro Static Discharge) has always been a rather serious problem of reliability. Enhanced ESD tolerance of IC chips became a focus of research on IC failure protection design.
Jun Shi
doaj   +1 more source

Characteristics of electrostatic discharges between metallic objects in the ion-flow field under HVDC lines

open access: yesThe Journal of Engineering, 2019
Metallic objects under high-voltage direct current (HVDC) transmission lines will produce certain induced voltages due to the charging of ion flow. Electrostatic discharge (ESD) may occur between two objects at different potentials when they are close ...
Xueshan Li, Donglai Wang, Tiebing Lu
doaj   +1 more source

Human body model electrostatic discharge tester using metal oxide semiconductor controlled thyristors

open access: yesETRI Journal, 2023
Electrostatic discharge (ESD) testing for human body model tests is an essential part of the reliability evaluation of electronic/electrical devices and components.
Dong Yun Jung   +7 more
doaj   +1 more source

Home - About - Disclaimer - Privacy