Results 111 to 120 of about 4,456 (178)

TCAD Simulation of STI Depth and SiO₂/Silicon Interface Trap Modulation Effects on Low-Frequency Noise in HZO-Based Nanosheet FETs. [PDF]

Nanomaterials (Basel)
Lee W, Lee J.
europepmc   +1 more source

Kir6.2 channel activity is regulated by interaction of transmembrane domains 1 and 2 through I167 in the bundle-crossing gate. [PDF]

Physiol Rep
Kawashima R, Meller C, Suzuki M, Kato S, Horita S, Hidema S, Misaka S, Hosoya M, Go H, Kobayashi K, de Wet H, Maejima Y, Shimomura K.   +12 more
europepmc   +1 more source

Oxide Semiconductor for Advanced Memory Architectures: Atomic Layer Deposition, Key Requirement and Challenges. [PDF]

Nanomicro Lett
Lee CH, Ryu SH, Hwang T, Kim SH, Kim YS, Park JS.   +5 more
europepmc   +1 more source

Archaeal family B DNA polymerase facilitates lagging strand DNA replication in the Thermococcales. [PDF]

Nucleic Acids Res
Liman GLS, Black MD, Potapov V, Burkhart BW, Levine K, Baker B, Mandley JL, Davidson SC, Gardner AF, Santangelo TJ, Zatopek KM.   +10 more
europepmc   +1 more source

3-Tier CFET 6T-SRAM with 2D-TMDs channels for Angstrom technology node. [PDF]

Sci Rep
Lee J, Lee J, Lee J, Ahn S, Jin D, Jeon J.   +5 more
europepmc   +1 more source

Molecular basis of human taurine transporter uptake and inhibition. [PDF]

Nat Commun
Du B, Cheng L, Xie J, Chen L, Yan K.
europepmc   +1 more source

Integration and electrical evaluation of WS₂ and MoS₂ fets in a 300 mm pilot line. [PDF]

Discov Electron
Schram T, Smets Q, Opdebeeck A, Ghosh S, Groven B, Kumar P, Medina HM, Cott D, deMarneffe JF, Dongre H, Kruv A, Panarella L, Pinotti LF, Morin P, Kar GS, Lockhart de la Rosa CJ.   +15 more
europepmc   +1 more source

Atomic Force Microscopy (AFM)-Based Metrology for Advanced Etching in Three-Dimensional Integrated Circuits. [PDF]

Micromachines (Basel)
Chang J, Wang S, Liang S, Feng X, Zhao W.   +4 more
europepmc   +1 more source

The Planar Core-Shell Junctionless MOSFET. [PDF]

Micromachines (Basel)
Dou C, Song W, Yan Y, Zhang X, Tang Z, Zhao X, Liu F, Xue S, Sun H, Wan J, Li B, Wang Y, Ye T, Xu Y, Cristoloveanu S.   +14 more
europepmc   +1 more source

Continue the Scaling of Electronic Devices with Transition Metal Dichalcogenide Semiconductors. [PDF]

Nano Lett
Zheng F, Meng W, Li LJ.
europepmc   +1 more source