Results 101 to 110 of about 3,848,813 (157)

Enhancement-Mode InAlN/GaN MISHEMT with Low Gate Leakage Current

, 2012
We report an enhancement-mode InAlN/GaN MISHEMT with a low gate leakage current by a thermal oxidation technique under gate.The off-state source-drain current density is as low as～10~(17) A/mm at V_(GS)= 0 V and V_(DS) = 5 V.The threshold voltage is ...
Gu GD(顾国栋), Cai Y(蔡勇), Feng ZH(冯志红), Zhang BS(张宝顺), Liu B(刘波), Yu GH(于国浩), Dong ZH(董志华), Ceng CH(曾春红)   +7 more
core  

Repurposing Si CMOS nonidealities for stochastic and analog image processing. [PDF]

Sci Adv
Kwak B, Koo RH, Han C, Shin Y, Choi J, Kim D, Lee J, Im J, Cho Y, Lee JH, Shin W, Kwon D.   +11 more
europepmc   +1 more source

Array of Cointegrated Transistor-Based Artificial Neurons and Synapses for Neuromorphic Computing. [PDF]

Small
Lee SW, Seo S, Jeong H, Han JK, Kim Y, Yoo D, Son JH, Yu JM, Choi S, Choi YK.   +9 more
europepmc   +1 more source

Oxide semiconductor gain cell-embedded memory: materials and integration strategies for next generation on-chip memory. [PDF]

Commun Eng
Chung SW, Yoon SH, Jeong JK.
europepmc   +1 more source

Design and Study of a Novel P-Type Junctionless FET for High Performance of CMOS Inverter. [PDF]

Micromachines (Basel)
Wang B, Tang Z, Song Y, Liu L, Yang W, Wu L.   +5 more
europepmc   +1 more source

Suppression of Short-Channel Effects in AlGaN/GaN HEMTs Using SiN_x Stress-Engineered Technique. [PDF]

Nanomaterials (Basel)
Deng C, Tang C, Wang P, Cheng WC, Du F, Wen K, Zhang Y, Jiang Y, Tao N, Wang Q, Yu H.   +10 more
europepmc   +1 more source

Simultaneously Estimating Process Variation Effect, Work Function Fluctuation, and Random Dopant Fluctuation of Gate-All-Around Silicon Nanosheet Complementary Field-Effect Transistors. [PDF]

Nanomaterials (Basel)
Kola SR, Li Y.
europepmc   +1 more source

Random Telegraph Noises from the Source Follower, the Photodiode Dark Current, and the Gate-Induced Sense Node Leakage in CMOS Image Sensors. [PDF]

Sensors (Basel), 2019
Chao CY, Yeh SF, Wu MH, Chou KY, Tu H, Lee CL, Yin C, Paillet P, Goiffon V.   +8 more
europepmc   +1 more source

High-Performance Carbon Nanotube Electronic Devices: Progress and Challenges. [PDF]

Micromachines (Basel)
Zhang Z, Zhang N, Zhang Z.
europepmc   +1 more source

Comprehensive Review of FinFET Technology: History, Structure, Challenges, Innovations, and Emerging Sensing Applications. [PDF]

Micromachines (Basel)
Karimi K, Fardoost A, Javanmard M.
europepmc   +1 more source