Results 71 to 80 of about 1,513 (185)

Effects of indium within a barrier on the gate leakage current in an InAlGaN/GaN high-electron-mobility transistor

open access: yesApplied Physics Express
We investigated the impact of In within barriers on the gate leakage current in InAlGaN/GaN high-electron-mobility transistors (HEMTs). The results revealed that the gate leakage current in the (In)AlGaN barriers depends solely on the two-dimensional ...
Atsushi Yamada, Toshihiro Ohki
doaj   +1 more source

An RC snubber design method to achieve optimized switching noise‐loss trade‐off of cascode GaN HEMTs

open access: yesIET Power Electronics
The cascode gallium nitride high electron mobility transistors (GaN HEMTs) are very vulnerable to self‐sustained turn‐off oscillation due to their cascode configuration.
Peng Xue, Eckart Hoene, Pooya Davari
doaj   +1 more source

AlGaN/GaN HEMT H₂ sensor with integrated Wheatstone bridge and on-chip microheater for 0.1-ppm detection. [PDF]

open access: yesMicrosyst Nanoeng
Yu Y   +9 more
europepmc   +1 more source

Advanced physical modeling approaches for high-precision TCAD simulation of GaN HEMT power devices: a review. [PDF]

open access: yesDiscov Nano
Zhao H   +6 more
europepmc   +1 more source

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