We investigated the impact of In within barriers on the gate leakage current in InAlGaN/GaN high-electron-mobility transistors (HEMTs). The results revealed that the gate leakage current in the (In)AlGaN barriers depends solely on the two-dimensional ...
Atsushi Yamada, Toshihiro Ohki
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An RC snubber design method to achieve optimized switching noise‐loss trade‐off of cascode GaN HEMTs
The cascode gallium nitride high electron mobility transistors (GaN HEMTs) are very vulnerable to self‐sustained turn‐off oscillation due to their cascode configuration.
Peng Xue, Eckart Hoene, Pooya Davari
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AlGaN/GaN HEMT H₂ sensor with integrated Wheatstone bridge and on-chip microheater for 0.1-ppm detection. [PDF]
Yu Y +9 more
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Advanced physical modeling approaches for high-precision TCAD simulation of GaN HEMT power devices: a review. [PDF]
Zhao H +6 more
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Source Field Plate Incorporated Monolithic Inverters Composed of GaN-Based CMOS-HEMTs with Double-2DEG Channels and Fin-Gated Multiple Nanochannels. [PDF]
Chen HY, Lee HY, Lee H, Wu YR, Lee CT.
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Improved Threshold Voltage Stability of p-GaN Gate HEMTs Under Off-State Drain Stress Using p-NiO RESURF Terminal. [PDF]
Pan J +8 more
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Electrical Properties and Performance Enhancement of AlGaN/GaN/Si HEMTs. [PDF]
Mosbahi H, Ali MKM, Gassoumi M.
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Review of the Gate Structure for Normally Off p-GaN High-Electron-Mobility Transistors Towards High Performances. [PDF]
Pu T, Li X, Li L, Ao JP.
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Structure-Dependent Parameter Trade-Off Optimization on <i>R</i><sub>on</sub><i>C</i><sub>off</sub> and Power Compression of AlGaN/GaN HEMTs for RF Switch Application. [PDF]
Zou X +11 more
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Demonstration of TFTs 3D monolithically integrated on GaN HEMTs using cascode configuration with high breakdown voltage (> 1900 V). [PDF]
Wu TL +5 more
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