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Lifelong Learning-Enabled Fractional Order-Convolutional Encoder Model for Open-Circuit Fault Diagnosis of Power Converters Under Multi-Conditions. [PDF]
Li T, Wang E, Yang J.
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Precursor Parameter Identification for Insulated Gate Bipolar Transistor (IGBT) Prognostics
IEEE Transactions on Reliability, 2009Diganta Das, Kai Goebel, Michael Pecht
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1.2 kV Trench Insulated Gate Bipolar Transistors (IGBT's) With Ultralow On-Resistance
IEEE Electron Device Letters, 1999Florin Udrea +2 more
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Insulated Gate Bipolar Transistor (IGBT) Modeling Using IG-SPICE
IEEE Transactions on Industry Applications, 1994A R Hefner, D Y Chen, F C Lee
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IEEE Transactions on Device and Materials Reliability, 2019
Hyunseok Oh, Junmin Lee, Chan Hee Park
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Hyunseok Oh, Junmin Lee, Chan Hee Park
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