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Precursor Parameter Identification for Insulated Gate Bipolar Transistor (IGBT) Prognostics

IEEE Transactions on Reliability, 2009
Diganta Das, Kai Goebel, Michael Pecht
exaly  

1.2 kV Trench Insulated Gate Bipolar Transistors (IGBT's) With Ultralow On-Resistance

IEEE Electron Device Letters, 1999
Florin Udrea   +2 more
exaly  

Insulated Gate Bipolar Transistor (IGBT) Modeling Using IG-SPICE

IEEE Transactions on Industry Applications, 1994
A R Hefner, D Y Chen, F C Lee
exaly  

Test Scheme and Degradation Model of Accumulated Electrostatic Discharge (ESD) Damage for Insulated Gate Bipolar Transistor (IGBT) Prognostics

IEEE Transactions on Device and Materials Reliability, 2019
Hyunseok Oh, Junmin Lee, Chan Hee Park
exaly  

Half Bridge Driver for MOSFET and IGBT Transistors

2019
Andrii Gladyr, Dobroslav Kovac
exaly  

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