Results 141 to 150 of about 12,526 (222)

Research on Underwater Constant High-Voltage DC Switching Technology for MCSEM. [PDF]

Sensors (Basel)
Ren Z, Wang M, Luo X, Wang C, Chen T.
europepmc   +1 more source

Performer-KAN-Based Failure Prediction for IGBT with BO-CEEMDAN. [PDF]

Micromachines (Basel)
Xiao Y, Wang F.
europepmc   +1 more source

Bioinspired thermally conducting packaging for heat management of high performance electronic chips. [PDF]

Commun Eng
Wang H, Bai P, Cui H, Zhang X, Tang Y, Liang S, Li S, Zhou G.   +7 more
europepmc   +1 more source

Novel non-resonant, low-frequency pulse-current circuit for energy-efficient, low-noise transcranial magnetic stimulation. [PDF]

Front Neurosci
Tan X, Tian Z, Tian J, Li Y, Shi J.
europepmc   +1 more source

Design and implementation of three-phases energy storage system using DSP F28379D for laboratory research. [PDF]

HardwareX
Nguyen HP, Nguyen TT, Le MP, Tran MT, Pham CD.   +4 more
europepmc   +1 more source

Design of TI-TMS system for deep brain stimulation with higher focus in neural modulation. [PDF]

Sci Rep
Zhang Y, Wang T, Cui C, Xu G.
europepmc   +1 more source

Research on Fault Prediction of Power Devices in Rod Control Power Cabinets Based on BiTCN-Attention Transfer Learning Model. [PDF]

Micromachines (Basel)
Chen Z, Ye L, Jian Y, Chen M, Min Y.
europepmc   +1 more source

Dual graph attention network for robust fault diagnosis in photovoltaic inverters. [PDF]

Sci Rep
Bhadra AB, Rime MHK, Sarker Y, Bhuiyan EA, Hossen MJ, Morol MK.   +5 more
europepmc   +1 more source

Design and control of LCC DVR. [PDF]

Sci Rep
Manju AS, Manitha PV, Nair MG, Joseph A.
europepmc   +1 more source

Bipolar Transistor Test Structures for Extracting Minority Carrier Lifetime in IGBTs

Bipolar Transistor Test Structures for Extracting Minority Carrier Lifetime in IGBTs
identifier:oai:t2r2.star.titech.ac.jp ...
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