Results 1 to 10 of about 582,766 (203)

Research Progress on Insulated Gate Bipolar Transistor (IGBT) Modules [PDF]

open access: yesMicromachines
With the rapid advancement of social productivity and technological innovation, the insulated gate bipolar transistor (IGBT) has emerged as a cornerstone in modern power electronic devices [...]
Peisheng Liu, Yaohui Deng
doaj   +5 more sources

Low Loss Insulated Gate Bipolar Transistor With Electron Injection (EI-IGBT)

open access: yesIEEE Journal of the Electron Devices Society, 2017
A new type insulated gate bipolar transistor (IGBT) with electron injection (EI-IGBT) is proposed in which an N+-buried layer is implemented in P-base region.
Wanjun Chen   +10 more
doaj   +4 more sources

Analysis of junction capacitance characteristics of trench gate IGBT [PDF]

open access: yesE3S Web of Conferences, 2021
Trench gate field termination IGBT represents the latest structure of insulated gate bipolar transistor (IGBT). Because the internal current of IGBT includes the charging and discharging current of gate capacitance and internal junction capacitance ...
Wang Bo
doaj   +2 more sources

The Effect of Neutrons on the Characteristics of the Insulated Gate Bipolar Transistor (IGBT) [PDF]

open access: yesIEEE Transactions on Nuclear Science, 1986
The effects of neutrons on the operating characteristics of Insulated Gate Bipolar Transistors (IGBT) are described. Experimental results are presented for devices that have been irradiated up to a fluence of 1013 neutrons/cm2, and an analytical model is presented which explains the observed effects. It is found that the on-state voltage increases, the
Kenneth Galloway, A R Hefner
exaly   +2 more sources

Effect of solder layer crack on the thermal reliability of Insulated Gate Bipolar Transistors

open access: yesCase Studies in Thermal Engineering, 2019
In order to study the thermal reliability of solder layer fatigue damage in Insulated Gate Bipolar Transistors (IGBT), the Finite Element Analysis (FEA) of the crack damage of the solder layer is described.
Mingxing Du   +4 more
doaj   +3 more sources

Insulated Gate Bipolar Transistor (IGBT) Modeling Using IG-SPICE

open access: yesIEEE Transactions on Industry Applications, 1994
A physics-based model for the insulated gate bipolar transistor (IGBT) is implemented into the widely available circuit simulation package IG-SPICE. Based on analytical equations describing the semiconductor-physics, the model accurately describes the nonlinear junction capacitances, moving boundaries, recombination, and carrier scattering, and ...
A R Hefner, D Y Chen, F C Lee
exaly   +2 more sources

Numerical Study of a Thyristor Injection Insulated Gate Bipolar Transistor (TI-IGBT) Using P-N-P Collector

open access: yesIEEE Journal of the Electron Devices Society, 2019
A new thyristor injection concept is proposed to decrease conductivity modulation effects in an Insulated Gate Bipolar Transistor (TI-IGBT), which adds a floating p-type layer and an n-type layer at the collector side.
Mengxuan Jiang, Yulei Wang
doaj   +3 more sources

Numerical Simulation Analysis on a Composite Edge Terminal Reverse Blocking IGBT

open access: yesZhongguo dianli, 2022
Insulated gate bipolar transistor (IGBT) is usually used in combination with power diode in power electric circuit because it has no reverse blocking ability.
Lei CUI   +4 more
doaj   +1 more source

Analysis of base characteristics of trench gate field termination IGBT [PDF]

open access: yesE3S Web of Conferences, 2021
Trench gate structure represents the latest structure of Insulated Gate Bipolar Transistor(IGBT). Because there are great differences in model analysis coordinate system and carrier transport between trench gate structure and planar gate structure, the ...
Wang Bo
doaj   +1 more source

Comparative study of electro‐thermal characteristics of 4500 V diffusion‐CS IGBT and buried‐CS IGBT

open access: yesIET Circuits, Devices and Systems, 2021
This article compares the major characteristics of the Insulated Gate Bipolar Transistor with Diffusion Carrier Stored (CS) layer (DCS‐IGBT) and the Insulated Gate Bipolar Transistor with the Buried CS layer (BCS‐IGBT).
Rui Jin   +6 more
doaj   +1 more source

Home - About - Disclaimer - Privacy