Results 21 to 30 of about 715 (178)

Aging Prediction of IGBT Based on Improved Support Vector Regression

open access: yesZhongguo dianli, 2022
In order to accurately predict the aging state of insulated gate bipolar transistor (IGBT), a novel IGBT aging prediction method is proposed based on improved whale optimization algorithm (IWOA) and optimized support vector regression (SVR).
Zhengxiong CHEN   +2 more
doaj   +1 more source

Development of 8-inch Key Processes for Insulated-Gate Bipolar Transistor

open access: yesEngineering, 2015
Based on the construction of the 8-inch fabrication line, advanced process technology of 8-inch wafer, as well as the fourth-generation high-voltage double-diffused metal-oxide semiconductor (DMOS+) insulated-gate bipolar transistor (IGBT) technology and
Guoyou Liu, Rongjun Ding, Haihui Luo
doaj   +1 more source

Analysis of the Usefulness Range of the Averaged Electrothermal Model of a Diode–Transistor Switch to Compute the Characteristics of the Boost Converter

open access: yesEnergies, 2020
In the design of modern power electronics converters, especially DC-DC converters, circuit-level computer simulations play an important role. This article analyses the accuracy of computations of the boost converter characteristics in the steady state ...
Paweł Górecki, Krzysztof Górecki
doaj   +1 more source

Analysis of junction capacitance characteristics of trench gate IGBT [PDF]

open access: yesE3S Web of Conferences, 2021
Trench gate field termination IGBT represents the latest structure of insulated gate bipolar transistor (IGBT). Because the internal current of IGBT includes the charging and discharging current of gate capacitance and internal junction capacitance ...
Wang Bo
doaj   +1 more source

Design Solutions for Device Structures of Bipolar Transistors with an Insulated Gate and a Vertical Channel Arrangement

open access: yesДоклады Белорусского государственного университета информатики и радиоэлектроники
This work presents the results of computer simulations of the operational characteristics of vertical channel Insulated Gate Bipolar Transistor (IGBT) device structures designed according to the following technologies: Trench-IGBT, Superjunction Trench ...
Trong Thanh Nguyen   +3 more
doaj   +1 more source

Detection and Recording of Acoustic Emission in Discrete IGBT Transistors [PDF]

open access: yesMultidisciplinary Aspects of Production Engineering, 2018
Abstract The article presents the results of experimental research, which is to show a correlation between the change of operating status of single IGBT transistor and its acoustic emission. Sensor signal was obtained with oscilloscope in order to further process it digitally and determine possibility of the damage to the element based ...
Radosław Gordon, Andrzej Dreas
openaire   +1 more source

Power Performance Comparison of SiC-IGBT and Si-IGBT Switches in a Three-Phase Inverter for Aircraft Applications

open access: yesMicromachines, 2022
The converters used to integrate the ground power station of planes with the utility grid are generally created with silicon-insulated gate bipolar transistor (Si-IGBT)-based semiconductor technologies. The Si-IGBT switch-based converters are inefficient,
Ibrahim A. S. Abdalgader   +2 more
doaj   +1 more source

Efficient Control of IGBT Transistor as Part of Overvoltage Protection

open access: yesIJEEC - INTERNATIONAL JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTING, 2017
The paper analyzes the phenomena of appearance of overvoltage during the switching-off of the IGBT transistor which arecaused by the presence of parasitic inductance in the switching circuit. This problem can be solved in two ways – by preventing thecause of the overvoltage, or by limiting the overvoltage level.
Nenad Jovančić   +2 more
openaire   +2 more sources

Effect of solder layer crack on the thermal reliability of Insulated Gate Bipolar Transistors

open access: yesCase Studies in Thermal Engineering, 2019
In order to study the thermal reliability of solder layer fatigue damage in Insulated Gate Bipolar Transistors (IGBT), the Finite Element Analysis (FEA) of the crack damage of the solder layer is described.
Mingxing Du   +4 more
doaj   +1 more source

A thermal network model considering thermal coupling effect and TIM degradation in IGBT modules

open access: yesEnergy Reports, 2023
Thermal interface materials (TIMs), as important materials for heat dissipation of insulated gate bipolar transistor (IGBT) modules, degrade under long-term thermal cycling, resulting in elevated junction temperatures and threatening the safe operation ...
Xiaotong Zhang   +5 more
doaj   +1 more source

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