Results 201 to 210 of about 19,199 (250)
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Optical proximity correction by e-beam over-correction
Microelectronic Engineering, 1999Proximity correction mechanism in e-beam systems can be explored to correct optical proximity effect in resist. Using a Hitachi HL-800 e-beam mask writer, we demonstrate optical proximity correction (OPC) for [email protected] attenuated phase-shifting contact holes with duty ratios from 1:1 to 1:5, for various optical settings and resist systems. This
C.H. Lin, S.D. Tzu, Anthony Yen
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Process dependencies of optical proximity corrections
SPIE Proceedings, 2001Optical Proximity Correction has emerged as an industry standard technique to reproduce the desired shapes on wafers as pattern dimensions are approaching the optical resolution limits. However secondary effects, if not properly controlled, may impede successful application of this technique.
Franz X. Zach +3 more
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Thermal treatment for optical proximity correction
Microelectronic Engineering, 2007For 32-nm technology node, thermal treatment is one of the process extension techniques with 193-nm ArF lithography equipment and chemically-amplified resist (CAR). However, it is difficult to use these techniques in the manufacture process because the optical proximity effect of thermal effects is quite severe.
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Adaptive Optical Proximity Correction Using an Optimization Method
7th IEEE International Conference on Computer and Information Technology (CIT 2007), 2007This paper proposes a new approach to the optical proximity correction (OPC) method which reduces OPC calculation loads by employing an optimization method. OPC is a method of correcting for a mask pattern to improve the fidelity of an image pattern on a silicon wafer.
Tetsuaki Matsunawa +8 more
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Improvement of YX42° Cut LiTaO3 SAW Filters with Optical Proximity Effect Correction Method
Micromachines, 2023Xing Han, , Yushuai Liu
exaly
Fast pixel-based optical proximity correction based on nonparametric kernel regression
Journal of Micro/ Nanolithography, MEMS, and MOEMS, 2014Yanqiu Li, Xu Ma, Shangliang Jiang
exaly
Optical proximity correction with hierarchical Bayes model
Journal of Micro/ Nanolithography, MEMS, and MOEMS, 2016Bei Yu +2 more
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PV-Aware Analog Sizing for Robust Analog Layout Retargeting with Optical Proximity Correction
ACM Transactions on Design Automation of Electronic Systems, 2018Xuan Dong, Lihong Zhang
exaly

