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Applications of enhanced optical proximity correction models
SPIE Proceedings, 1998The accurate prediction of relevant optical and other processing effects is the essential first element of optical proximity effect (OPC) methodologies. A quasi-empirical modeling technique has been devised. Starting from standard aerial-image energy deposition, an exponential transfer function is employed to account for saturation effects.
Jack Q. Zhao +4 more
openaire +1 more source
0.18 μm KrF lithography using optical proximity correction based on empirical behavior modeling
Journal of Vacuum Science & Technology B, 1998Kurt Ronse
exaly
A fast and manufacture-friendly optical proximity correction based on machine learning
Microelectronic Engineering, 2017Yanqiu Li, Xu Ma, Shangliang Jiang
exaly
Source imperfection impacts on optical proximity correction Available to Purchase
Journal of Vacuum Science & Technology B, 2016Lawrence S Melvin, Chander Sawh
exaly
Fast aerial image simulations using one basis mask pattern for optical proximity correction
Journal of Vacuum Science & Technology B, 2011Shiyuan Liu, Chuanwei Zhang
exaly

