Doping-induced performance optimization in monolayer WS<sub>2</sub> memristor: reduced variability and contact resistance. [PDF]
Tanisha TT, Hassan O, Alam MK.
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An innovative semiconducting Ni(II)-metallogel based robust random access memory (RRAM) device for advanced flexible electronics applications. [PDF]
Roy A +9 more
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Enhancing Stability and Performance of Conductive Bridge Random Access Memory: Use of a Copper-Doped ZnO Nanorod-Embedded Switching Layer. [PDF]
Liu PT +6 more
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Modeling of Conduction Mechanism in Filament-free Multi-layer Bulk RRAM. [PDF]
Zhou Y +7 more
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Improving the Nonvolatile Memory Characteristics of Sol-Gel-Processed Y2O3 RRAM Devices Using Mono-Ethanolamine Additives. [PDF]
Heo S +8 more
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The Role of Phase-Change Memory in Edge Computing and Analog In-Memory Computing: An Overview of Recent Research Contributions and Future Challenges. [PDF]
Antolini A +8 more
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Related searches:
Recent progress of resistive switching random access memory (RRAM)
2012 IEEE Silicon Nanoelectronics Workshop (SNW), 2012This paper gives an overview of recent works on metal oxide resistive switching memory (RRAM). We explored the stochastic nature of resistive switching in metal oxide RRAM and a 2-D analytical solver was established to explain the switching parameter variations in HfOx-based RRAM.
Yi Wu +3 more
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Verilog-A compact model for oxide-based resistive random access memory (RRAM)
2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 2014We demonstrate a dynamic Verilog-A RRAM compact model capable of simulating real-time DC cycling and pulsed operation device behavior, including random variability that is inherent to RRAM. This paper illustrates the physics and capabilities of the model. The model is verified using different sets of experimental data.
Zizhen Jiang +5 more
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Access Strategies for Resistive Random Access Memory (RRAM)
ECS Transactions, 2012In an RRAM array, it is important to avoid sneak current paths that result in inadvertent, non-negligible voltage and current inputs to unselected cells. At the same time, care must be taken not to allow excessive voltages or currents to selected cells, which could result in damage.
Frederick T. Chen +14 more
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Fundamentals of Metal-Oxide Resistive Random Access Memory (RRAM)
2018Detailed operational and switching characteristics for metal-oxide resistive random access memory (RRAM) are presented, along with materials/vacancy engineering ramifications for the switching operations. The reported experimental data is consistent with a physical picture of the RRAM switching as caused by oxidation/reduction processes in a conductive
David C. Gilmer, Gennadi Bersuker
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