Results 51 to 60 of about 6,733 (243)
Next generation wireless networks are expected to be extremely complex due to their massive heterogeneity in terms of the types of network architectures they incorporate, the types and numbers of smart IoT devices they serve, and the types of emerging ...
Abdulmalik Alwarafy +4 more
doaj +1 more source
Simulations of RRAM-Based SSDs
In this chapter SSDExplorer, a fine-grained SSD simulator, is used to evaluate the possible impact of emerging non-volatile memories, such as Resistive RAM (RRAM), on future SSD architectures. Does it make sense to fully replace NANDs with one of the emerging memories? What’s the benefit?
Zuolo, Lorenzo +3 more
openaire +2 more sources
Forming‐free epitaxial Pt/La0.5Sr0.5CoOx (LSCO)/La0.5Sr0.5MnO3 (LSMO) memristors exhibit heterogeneous and partially reversible topotactic switching involving brownmillerite (BM)‐, Grenier (GN)‐like‐, and perovskite (PV)‐like configurations. Atomic‐resolution scanning transmission electron microscopy and in situ transmission electron microscopy resolve
Zi‐Qin Hong +5 more
wiley +1 more source
Resistive random-access memory (RRAM) is a crucial element for next-generation large-scale memory arrays, analogue neuromorphic computing and energy-efficient System-on-Chip applications.
Mikhail Fedotov +2 more
doaj +1 more source
Graphene-based RRAM devices for neural computing
Resistive random access memory is very well known for its potential application in in-memory and neural computing. However, they often have different types of device-to-device and cycle-to-cycle variability.
Rajalekshmi T. R +3 more
doaj +1 more source
Neuromorphic devices for extreme environments are interpreted through the physical states that store and process information. Radiation, temperature extremes, and vacuum can perturb vacancies, filaments, trapped charges, polarization, interfaces, and readout signals.
Taehyun Park +7 more
wiley +1 more source
RRAM device with different switching layer thicknesses
This paper presents switching characteristics of Ni/HfOx/p(+)-Si with different switching layer thicknesses (5/10 nm) in DC mode. Larger forming voltage and on/off ratio is obtained from the 10 nm HfOx RRAM while step-like reset process is seen from 5 nm
Min-Hwi Kim +15 more
core +1 more source
Write Termination circuits for RRAM : A Holistic Approach From Technology to Application Considerations [PDF]
While Resistive Random Access Memories (RRAM) are perceived nowadays as a promising solution for the future of computing, these technologies suffer from intrinsic variability regarding programming voltage, switching speed and achieved resistance values ...
Atienza Alonso, David +22 more
core +1 more source
Neuromorphic plasticity in OECTs is governed by the post‐stimulus evolution of coupled ionic and electronic states. Semiconductor chemistry and morphology, electrolyte composition and interfaces, and device architecture regulate ion injection, transport, confinement, and release, shifting responses from rapidly relaxing STP to metastable memory and ...
Inho Lee +9 more
wiley +1 more source
Due to the difficulties associated with scaling of silicon transistors, various technologies beyond binary logic processing are actively being investigated.
Furqan Zahoor +4 more
doaj +1 more source

