Results 151 to 160 of about 13,076 (221)

A 3.3 kV SiC Semi-Superjunction MOSFET with Trench Sidewall Implantations. [PDF]

open access: yesMicromachines (Basel)
Boccarossa M   +8 more
europepmc   +1 more source

Nondestructive detection and identification of electrically active threading dislocations in n<sup>+</sup>-SiC substrates. [PDF]

open access: yesNanoscale Adv
Kurniawan IS   +8 more
europepmc   +1 more source

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