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Humidity testing of SiC power MOSFETs

2016 IEEE 8th International Power Electronics and Motion Control Conference (IPEMC-ECCE Asia), 2016
Humidity and outdoor application are a challenge for Silicon (Si) and Silicon Carbide (SiC) applications. This paper investigates the effect of humidity on SiC power MOSFET modules in a real application where no acceleration factors such as pressure or high temperature are applied.
Diane-Perle Sadik   +3 more
openaire   +1 more source

Inversion Layer Mobility in SiC MOSFETs

Materials Science Forum, 1998
Lateral MOSFETs (metal oxide semiconductor field effect transistors) were fabricated of 6H-SiC and 4H-SiC using a non-selfaligned technology. A low temperature deposited oxide was used as the gate dielectric. After deposition the oxide was subjected to both inert as well as oxidizing anneals. In this paper, we report the first lateral n-channel MOSFETs
S. Sridevan, B.J. Baliga
openaire   +1 more source

Counter-doped MOSFETs of 4H-SiC

IEEE Electron Device Letters, 1999
In this paper, we investigate the effect of counter-doping of nitrogen at the channel region of epitaxial n-channel 4H-SiC MOSFETs on the channel mobility and the threshold voltage. From this study, we have found that the channel mobility steeply improves as the nitrogen dose increases.
K. Ueno, T. Oikawa
openaire   +1 more source

Channel Doped SiC-MOSFETs

Materials Science Forum, 2000
Shinji Ogino   +2 more
openaire   +1 more source

A hybrid III–V tunnel FET and MOSFET technology platform integrated on silicon

Nature Electronics, 2021
Clarissa Convertino   +2 more
exaly  

Reliability and stability of SiC power mosfets and next-generation SiC MOSFETs

2014 IEEE Workshop on Wide Bandgap Power Devices and Applications, 2014
B. Hull   +13 more
openaire   +1 more source

Advancement and challenges in MOSFET scaling

Materials Science in Semiconductor Processing, 2021
Ratneshwar Kumar Ratnesh, Chandan
exaly  

Performance Evaluation of High-Power SiC MOSFET Modules in Comparison to Si IGBT Modules

IEEE Transactions on Power Electronics, 2019
Lei Zhang, Xibo Yuan, Xiaojie Wu
exaly  

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