Results 101 to 110 of about 10,455 (213)
A High-Reliability 12T SRAM Radiation-Hardened Cell for Aerospace Applications. [PDF]
Yao R +6 more
europepmc +1 more source
Integrated circuits suffer severe deterioration due to single-event upsets (SEUs) in irradiated environments. Spin-transfer torque magnetic random-access memory (STT-MRAM) appears to be a promising candidate for next-generation memory as it shows ...
Shubin Zhang +3 more
doaj +1 more source
Radiation Mitigation and Power Optimization Design Tools for Reconfigurable Hardware in Orbit [PDF]
The Reconfigurable Hardware in Orbit (RHinO)project is focused on creating a set of design tools that facilitate and automate design techniques for reconfigurable computing in space, using SRAM-based field-programmable-gate-array (FPGA) technology.
French, Matthew +4 more
core +1 more source
This paper presents a register-transfer-level (RTL) fault injection study of the LEON3 processor’s internal memory subsystem under single-event upsets (SEUs). The analysis targets four key components: the instruction cache (I-cache), data cache (D-cache),
Afef Kchaou, Sehmi Saad, Hatem Garrab
doaj +1 more source
The effects of high energy particles on planetary missions [PDF]
Researchers review the background and motivation for the detailed study of the variability and uncertainty of the particle environment from a space systems planning perspective. The engineering concern raised by each environment is emphasized rather than
Robinson, Paul A., Jr.
core +1 more source
Radiation-Hardened 20T SRAM with Read and Write Optimization for Space Applications
With continued CMOS scaling, transistor miniaturization has significantly raised SRAM integration density while lowering the critical charge (Qc), increasing cell vulnerability to spaceborne high-energy particles.
Kon-Woo Kim, Eun Gyo Jeong, Sung-Hun Jo
doaj +1 more source
The Effectiveness of TAG or Guard-Gates in SET Suppression Using Delay and Dual-Rail Configurations at 0.35 microns [PDF]
Design options for decreasing the susceptibility of integrated circuits to Single Event Upset (SEU) fall into two categories: (1) increasing the critical charge to cause an upset at a particular node, and (2) employing redundancy to mask or correct ...
Balasubramanian, Anupama +5 more
core +1 more source
A ReRAM-Based Non-Volatile and Radiation-Hardened Latch Design. [PDF]
Yan A +7 more
europepmc +1 more source
Solar and Galactic Cosmic Rays observed by SOHO
Both the Cosmic Ray Flux (CRF) and Solar Energetic Particles (SEPs) have left an imprint on SOHO technical systems. While the solar array efficiency degraded irreversibly down to ~77% of its original level over roughly 1 1/2 solar cycles, Single Event ...
Curdt, Werner, Fleck, Bernhard
core
Working group written presentation: Trapped radiation effects [PDF]
The results of the Trapped Radiation Effects Panel for the Space Environmental Effects on Materials Workshop are presented. The needs of the space community for new data regarding effects of the space environment on materials, including electronics are ...
Coulter, D. +9 more
core +1 more source

