Results 21 to 30 of about 12,854,075 (243)

Investigation of Radiation Effects on FD-SOI Hall Sensors by TCAD Simulations

Sensors, 2020
This work investigates the responses of the fully-depleted silicon-on-insulator (FD-SOI) Hall sensors to the three main types of irradiation ionization effects, including the total ionizing dose (TID), transient dose rate (TDR), and single event ...
Linjie Fan, Jinshun Bi, Kai Xi, Gangping Yan   +3 more
doaj   +1 more source

Simulation Studies on Single-Event Effects and the Mechanisms of SiC VDMOS from a Structural Perspective

Micromachines, 2023
The single-event effect reliability issue is one of the most critical concerns in the context of space applications for SiC VDMOS. In this paper, the SEE characteristics and mechanisms of the proposed deep trench gate superjunction (DTSJ), conventional ...
Tao Liu, Yuan Wang, Rongyao Ma, Hao Wu, Jingyu Tao, Yiren Yu, Zijun Cheng, Shengdong Hu   +7 more
doaj   +1 more source

Modeling single-event transients in complex digital systems [PDF]

, 2002
A methodology to determine the effect of single-event transients (SETs) on complex digital systems has been developed. This methodology is based on the SET-state-transition model. This model breaks the complex digital system down into five states.
Clark, Kenneth A.
core   +2 more sources

Update of Single Event Effects Radiation Hardness Assurance of Readout Integrated Circuit of Infrared Image Sensors at Cryogenic Temperature

Sensors, 2018
This paper review presents Single Event Effects (SEE) irradiation tests under heavy ions of the test-chip of D-Flip-Flop (DFF) cells and complete readout integrated circuits (ROIC) as a function of temperature, down to 50 K.
Laurent Artola, Ahmad Al Youssef, Samuel Ducret, Franck Perrier, Raphael Buiron, Olivier Gilard, Julien Mekki, Mathieu Boutillier, Guillaume Hubert, Christian Poivrey   +9 more
doaj   +1 more source

28nm Fault-Tolerant Hardening-by-Design Frequency Divider for Reducing Soft Errors in Clock and Data Recovery

IEEE Access, 2019
A fault-tolerant hardening-by-design frequency divider has been proposed for clock and data recovery in a 28-nm CMOS process. By means of the mandatory updating mechanism, the proposed divider can update the state of the D flip-flops from an error state ...
Hengzhou Yuan, Yang Guo, Jianjun Chen, Yaqing Chi, Xi Chen, Bin Liang   +5 more
doaj   +1 more source

SET Pulse Characterization and SER Estimation in Combinational Logic with Placement and Multiple Transient Faults Considerations

Technologies, 2020
Integrated circuit susceptibility to radiation-induced faults remains a major reliability concern. The continuous downscaling of device feature size and the reduction in supply voltage in CMOS technology tend to worsen the problem.
Georgios Ioannis Paliaroutis, Pelopidas Tsoumanis, Nestor Evmorfopoulos, George Dimitriou, Georgios I. Stamoulis   +4 more
doaj   +1 more source

Highly Reliable Quadruple-Node Upset-Tolerant D-Latch

IEEE Access, 2022
As CMOS technology scaling pushes towards the reduction of the length of transistors, electronic circuits face numerous reliability issues, and in particular nodes of D-latches at nano-scale confront multiple-node upset errors due to their operation in ...
Seyedehsomayeh Hatefinasab, Akiko Ohata, Alfonso Salinas, Encarnacion Castillo, Noel Rodriguez   +4 more
doaj   +1 more source

Synergistic effect of total ionizing dose and single-event upset in the analog/digital converter AD574

Fushe yanjiu yu fushe gongyi xuebao, 2021
This study investigates the AD574, a 12-bit analog/digital converter (ADC) produced by American Analog Devices, Inc. (ADI) using bipolar/I2L technology. The test samples are subjected to a total ionizing dose (TID) of 400 Gy(Si) under 60Co γ irradiation.
XIANG Chuanfeng, YAO Shuai, YU Xin, LI Xiaolong, LU Wu, WANG Xin, LIU Mohan, SUN Jing, GUO Qi, CAI Jiao, YANG Sheng   +10 more
doaj   +1 more source

A Single-Event Transient Radiation Hardened Low-Dropout Regulator for LC Voltage-Controlled Oscillator

, 2022
A voltage-controlled oscillator (VCO) is an essential part of the clock circuitry in satellite communication systems. Low-dropout regulators (LDO) provide stable voltage supply to the VCO and inevitably bring in new radiation-sensitive nodes.
Yang Guo, Xi Chen, Qiancheng Guo, Hengzhou Yuan   +3 more
core   +1 more source

Single Event Transient Sensitivity Measurement and Worst-Case Test Vector Exploration for ASIC Devices Exposed to Space Single Event Environment [PDF]

, 2022
Space radiation and nuclear reactors produce single event effects (SEE) in electronic circuits and impact their performance. The SEE phenomena cause circuits and electronic devices to fail by producing faulty results.
Wael, Mohamed
core