Design and Comparison of SEU Tolerant 10T Memory Cell for Radiation Environment Applications
Single event upsets (SEUs), which are caused by radiation particles, have emerged as a significant concern in aircraft applications. Soft mistakes, which manifest as corruption of data in memory chips and circuit faults, are mostly produced by SEUs. The
P Mangayarkarasi +2 more
doaj +1 more source
Monte Carlo Simulation of Proton Upsets in Xilinx Virtex-II FPGA Using a Position Dependent Q(sub crit) with PROPSET [PDF]
This paper describes new software simulation code for predicting single event upset data from measured heavy ion data, using methods, code, and algorithms already reported in the open literature.
Foster, Charles C. +2 more
core +1 more source
A synthetic benzoxazine dimer derivative targets c‐Myc to inhibit colorectal cancer progression
Benzoxazine dimer derivatives bind to the bHLH‐LZ region of c‐Myc, disrupting c‐Myc/MAX complexes, which are evaluated from SAR analysis. This increases ubiquitination and reduces cellular c‐Myc. Impairing DNA repair mechanisms is shown through proteomic analysis.
Nicharat Sriratanasak +8 more
wiley +1 more source
Heavy ion induced Single Event Phenomena (SEP) data for semiconductor devices from engineering testing [PDF]
The accumulation of JPL data on Single Event Phenomena (SEP), from 1979 to August 1986, is presented in full report format. It is expected that every two years a supplement report will be issued for the follow-on period. This data for 135 devices expands
Coss, James R. +4 more
core +1 more source
This study integrates transcriptomic profiling of matched tumor and healthy tissues from 32 colorectal cancer patients with functional validation in patient‐derived organoids, revealing dysregulated metabolic programs driven by overexpressed xCT (SLC7A11) and SLC3A2, identifying an oncogenic cystine/glutamate transporter signature linked to ...
Marco Strecker +16 more
wiley +1 more source
Reliability of LEON3 Processor’s Program Counter Against SEU, MBU, and SET Fault Injection
This paper presents a comprehensive register transfer-level (RTL) fault injection study targeting the program counter (PC) of the LEON3 processor, a SPARC V8-compliant core widely used in safety-critical and radiation-prone embedded applications.
Afef Kchaou +3 more
doaj +1 more source
Reprogrammable field programmable gate array with integrated system for mitigating effects of single event upsets [PDF]
An integrated system mitigates the effects of a single event upset (SEU) on a reprogrammable field programmable gate array (RFPGA). The system includes (i) a RFPGA having an internal configuration memory, and (ii) a memory for storing a configuration ...
Herath, Jeffrey A., Ng, Tak-kwong
core +1 more source
Aggressive prostate cancer is associated with pericyte dysfunction
Tumor‐produced TGF‐β drives pericyte dysfunction in prostate cancer. This dysfunction is characterized by downregulation of some canonical pericyte markers (i.e., DES, CSPG4, and ACTA2) while maintaining the expression of others (i.e., PDGFRB, NOTCH3, and RGS5).
Anabel Martinez‐Romero +11 more
wiley +1 more source
Compendium of Current Single Event Effects for Candidate Spacecraft Electronics for NASA [PDF]
NASA spacecraft are subjected to a harsh space environment that includes exposure to various types of ionizing radiation. The performance of electronic devices in a space radiation environment are often limited by their susceptibility to single event ...
Berg, Melanie D. +8 more
core +1 more source
Method and apparatus for increasing resistance of bipolar buried layer integrated circuit devices to single-event upsets [PDF]
Bipolar transistors fabricated in separate buried layers of an integrated circuit chip are electrically isolated with a built-in potential barrier established by doping the buried layer with a polarity opposite doping in the chip substrate.
Zoutendyk, John A.
core +1 more source

